dB Control’s high-power, environmentally sealed broadband and narrow band RF PIN Diode switches and assemblies ensure accurate test and measurement of multiple RF components used in radar systems, electronic warfare systems, ground-based communications systems and other applications.

dB Control’s compact Detector Logarithmic Video Amplifiers (DLVA) and Successive DLVAs (SDLVA) are environmentally sealed packages featuring limited RF output, plus excellent absolute accuracy and log linearity.

The RTP5000 peak USB power sensors paired with Boonton’s Real-Time Power Processing deliver 100,000 measurements per second, no gaps in signal acquisition and zero measurement latency. Combining this performance with automatic pulse measurements, CCDF and crest factor statistical analysis, multi-channel capabilities and documentation tools RTP5000 peak power sensors are the ideal instrument for fast, accurate and reliable RF power measurements.

The PMX40 power meter from Boonton provides design engineers and technicians the utility of traditional benchtop instrument, the flexibility and performance of modern USB RF power sensors, and the simplicity of a multi-touch display built with Boonton award-winning technology.

MtronPTI's M626x series of products uses a high-Q crystal with a newer generation of integrated circuit (IC) resulting in an excellent phase noise of -156dBc/Hz at 10kHz offset and tight stability down to +/-0.1ppm over - 40°C to +85°C. 

RF and microwave power measurements are crucial in obtaining optimal performance of communications and radar systems. Boonton, a leader in RF and microwave test equipment, provides cutting-edge test solutions, as well as insight into the fundamentals of capturing these essential measurements.

The new components and technologies required for 5G deployments must provide reliable operation in the presence of real-world noise and interference. Noisecom noises sources generate the broadband noise required to do this type of benchmarking, enabling 5G development and deployment through quantifying component and system performance across the microwave and mmWave bands.

The demand for higher data rates and lower power consumption has tightened requirements for  high-speed semiconductor devices.  To address power and signal integrity challenges, Noisecom J7000 and JV9000 noise generators enable real-world evaluation and tolerance testing to ensure these components can be powered correctly and function at high data rates.