Mastering EVM: Measuring EVM With Power Amplifiers

Error Vector Magnitude (EVM) is a key performance metric in wireless communications, commonly measured by manufacturers of 5G and 802.11 RF components, as well as in consumer electronics.

While signal generators typically offer excellent performance, standard test systems often introduce significant loss, which can pose challenges, especially when testing high-power devices that require greater input power.

To overcome this, what solutions are available to amplify the signal and increase the power delivered to the Device Under Test (DUT)? Furthermore, how can EVM be accurately measured when a power amplifier is used to boost the signal, ensuring consistent and precise test results?

Speaker: Martin Lim, 5G Component Technology Lead, Rohde & Schwarz USA, Inc.

Martin Lim is a national application engineer at Rohde & Schwarz with 22 years of experience in semiconductor, wireless, and RF testing. He currently focuses on mmWave 5GNR physical layer testing, with past projects including the development of 5GNR mmWave test systems, envelope tracking, amplifier (FEMiD) testing, 802.11AC MIMO, and test automation. Before joining R&S, Martin was the RF Characterization Manager at Nokia Mobile Phones, responsible for cellular Tx/Rx, GPS, and 802.11 test system development. He holds a B.S. in Electrical Engineering from California Polytechnic, Pomona.