TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Understanding Component EMC Testing for ICs

    If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

  • Solving Tomorrow's Obsolescence Challenges Today

    This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.

  • Basic Bulk Current Injection Testing

    Bulk current injection (BCI) testing is a conducted susceptibility procedure that uses an injection current probe. This paper provides an example of BCI testing, covering all steps, including gathering the required equipment, pre-calibration procedures, injection testing procedures, and safety precautions.

  • Accurately Measure Your UWB Device's Time Of Flight

    The R&S®CMP200 radio communication tester together with the R&S®CM-Z300A time of flight kit provides an accurate setup for time of flight measurements – in validation, calibration and certification.

  • Directivity And VSWR Measurements: Understanding Return Loss Measurements

    The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

TEST & MEASUREMENT SOLUTIONS

The Model 6350S is a small form factor 8-channel A/D & D/A subsystem designed for a variety of applications including high-bandwidth data streaming, waveform signal generators, multimode data acquisition, and other electronic warfare systems. Designed to be integrated into larger systems with minimal design effort, the 6350S delivers the performance and high-channel density of RFSoC in a small, convenient footprint.

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

The A.H. Systems' line of Current Probe Calibration Fixtures are a great way to keep your broadband Current Probes, and Injection Current Probes calibrated and up to date. Their rugged design ensures long life, and faultless operation over the wide calibration frequency range of 10 kHz to 1000 MHz.

Pentek offers the Talon® RTX 2684 as a 26 GHz sentinel intelligent signal scanner recording system. The system provides SIGINT engineers the ability to scan the RF spectrum from 1 GHz to 26 GHz for signals of interest and monitor or record bandwidths up to 500 MHz wide.

Producing a system that excels in performance and reliability is easy when you have System Design and Applications Engineers with years of experience, Customer Service with global reach, and products that are known for performance and quality. AR has this very organization and product offerings. AR is here for you at each step to ensure that the system design, integration, and support of your EMC or RF system complies with your goals.

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.