TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Combining On-Wafer VNA And Spectrum Analyzer Measurements

  This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.

• Test Automotive Radar Interference Mitigation

  Automotive radar is crucial for achieving Net Zero targets in the automobile industry, and the R&S AREG800A radar echo generator is essential for testing sensor immunity to interference.

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

• How To Configure Generic Devices In R&S Elektra

  R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

• Making Higher Accuracy Oscilloscope Measurements

  One of the most important functional blocks in a digital oscilloscope is the analog-to-digital converter or ADC. This white paper explains why ADC resolution has become a more important consideration in oscilloscopes, especially for measuring small signal details.