TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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Design Of A Complete RF Downconverter Module For Test Equipment
The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.
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EMI Debugging Using Fast FFT With MXO Oscilloscopes
Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.
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Making Higher Accuracy Oscilloscope Measurements
One of the most important functional blocks in a digital oscilloscope is the analog-to-digital converter or ADC. This white paper explains why ADC resolution has become a more important consideration in oscilloscopes, especially for measuring small signal details.
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Top 10 Considerations For Automotive EMC Chamber Design And Testing
This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions