TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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EMI Debugging Using Fast FFT With MXO Oscilloscopes
Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.
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Small Cell Testing In FR2
In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.
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Technical Report: Simulation Of Plasma Materials In XFdtd
This paper discusses the FDTD method to simulate the behavior of plasma materials using Remcom’s XFdtd 3D EM Simulation Software and presents validation in one and three dimensions.
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Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle
Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.
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Accurate Test Fixture Characterization And De-Embedding
This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions