TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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How To Configure Generic Devices In R&S Elektra
R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.
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Directivity And VSWR Measurements: Understanding Return Loss Measurements
The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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Power Supply Control Loop Response Measurements (Bode Plot)
The R&S® RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers.
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Four Practical Applications Using An Electronic Load
This article presents four tips on how to test with electronic loads and illustrate the flexibility and usefulness of a DC electronic load.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions