RF Test And Measurement Resource Center

TEST AND MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Telecommunications Testing Using AR Amplifiers

  This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

• 1-port USB VNAs Provide Cost, Throughput Advantages in Variety of Environments

  This application note discusses the use of a 1-port VNA that’s simpler and less expensive, but can still satisfy most testing requirements in mobile communications and automotive applications.

• An Introduction To Practical Real-Time Spectrum Analysis

  This application note provides an introduction to the practical uses of RTSAs to reveal important information about the performance of RF/microwave components, track down sources of interference, and monitor the spectrum for activity and security threats.

• Benchmark Simulations Of Waveguide Components

  There is a driving need for more accurate and compact waveguide components at higher frequencies, while maintaining cost-effective solutions. This application note presents a handful of benchmark simulations of waveguide components performed with FEKO.

• White Paper: BTS System Line Sweep And PIM Testing
• Application Note: Mixer VNA Measurements
• R&S dB Calculator
• Fast Validation Of EMC Test Sites Above 1 GHz With Time Domain
• RF/Microwave DUT De-embedding