TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Verifying The Clock Source

  In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

• VSWR Conversion To Reflected Power

  VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.

• Small Cell Testing In FR2

  In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Transmit And Receive Testing Of Digital Waveforms Using R&S®CMA180

  The compact R&S®CMA180 Radio Test Set allows straightforward tests on devices that use analog or digital modulation and demodulation formats. This application note focuses on the use of the digital radio capabilities for measurements on radio transceiving devices in terms of their functionality and parameter characterization. Also shown is how to use the instrument with the various software tools available from Rohde & Schwarz for creating and evaluating digitally modulated signals.