TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• RF/Microwave DUT De-embedding

  When analyzing a complex RF signal, characterizing a fast clock, or debugging a high-speed interface, it is important to observe the real signal and not artifacts of the test setup like loading or reflections. The process of removing non-ideal signal path effects is called de-embedding. This application note describes how to perform high-precision RF and microwave tests requiring de-embedding.

• Low Noise Amplifier Testing Challenges

  Designers, modelers, and manufacturers of RF and microwave frequency amplifiers used in applications such as radar, wireless communication, or high-speed digital communication systems at either the wafer-level or as a packaged part face many test challenges. Higher performance requirements in the face of tighter budgets and more demands on test engineer time result in the need for test systems which provide technical leadership while remaining cost effective, easy to use, and flexible.

• Fast Validation Of EMC Test Sites Above 1 GHz With Time Domain

  EMI test sites for radiated emission measurements in the 1 GHz to 18 GHz frequency range rely on free space conditions to minimize the influence of reflections. Site validation determines the deviations from the free space conditions that are necessary to meet acceptance criterion. This app note covers two approaches for showing compliance with the acceptance criterion.

• Solution For BCI Applications

  Rohde & Schwarz provides a compact solution for conducted immunity tests with a signal generator, RF solid-state amplifier up to 350 W, power sensors, and test software for frequencies from 4 kHz to 400 MHz.

• Small Cell Testing In FR2

  In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.