TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• Navigating Design Complexities With Qorvo's Innovative Software Tools

  Unlock the power of Qorvo's Design Hub, providing engineers with cutting-edge RF and analog design tools previously exclusive to Qorvo teams. Streamline your projects with precision and efficiency.

• Certium VCS Test System For Aircraft Manufacturers

  New aircraft need to have their radiocommunication systems tested with compact voice communication systems like CERTIUM VCS. This is cost-effective, space-saving, and scalable thanks to its IP-based infrastructure.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Combining On-Wafer VNA And Spectrum Analyzer Measurements

  This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.