TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Perform High Impedance Measurements With Spectrum Analyzers

    Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

  • VCO Measurements With FSPN Phase Noise Analyzer

    This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.

  • Telecommunications Testing Using AR Amplifiers

    This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.

  • Measurement Of The Phase Between Several Signals

    Measurement of magnitude can be done with spectrum analyzers, power meters etc. For a phase measurement, a VNA is the easiest, fastest and most accurate instrument. 

  • Accurately Measure Your UWB Device's Time Of Flight

    The R&S®CMP200 radio communication tester together with the R&S®CM-Z300A time of flight kit provides an accurate setup for time of flight measurements – in validation, calibration and certification.

TEST & MEASUREMENT SOLUTIONS

Qorvo introduces the QPC2040 single-pole, double-throw (SPDT) switch operating within the 8 – 12 GHz frequency range for commercial and military radar, communications, electronic warfare, test instrumentation, and other general purpose applications. The switch typically supports 10 W input power handling at control voltages of 0/−2 V for both CW and pulsed RF operations.

Pentek offers the Talon® RTX 2684 as a 26 GHz sentinel intelligent signal scanner recording system. The system provides SIGINT engineers the ability to scan the RF spectrum from 1 GHz to 26 GHz for signals of interest and monitor or record bandwidths up to 500 MHz wide.

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

The dB-9004 is a custom-mounted Integrated Antenna Digital Control Unit (IADCU). It operates in the C, X and Ku-band frequency range and provides highly accurate RF output (FM, AM and pulse-shape modulated)

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.