RF Test And Measurement Resource Center
TEST AND MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
Measuring Ultra Low Noise Metrological Reference
Signal sources with very low phase noise have significantly improved in their performance over the past few years. However, it has also become increasingly difficult to measure such low phase noises with standard and even dedicated phase noise measurement systems.
Time Domain Measurements Using Vector Network Analyzers Vector Network Analyzers (VNAs) are very powerful and flexible measuring instruments. Their basic capability is to measure the S-parameters of an RF or microwave device and display the result in the frequency domain. This provides valuable data for the design engineer to develop a design and for the production engineer to substantiate the performance of the device or system.
Real-Time Radar Target Generation
As radar test systems are essential for the research, development, production, and maintenance of radar systems, it would be prudent to use one that has the ability to test the entire system including the antenna front end. This application note presents a solution from Rohde & Schwarz that is capable of testing the complete radar system.
The Journey Of A Signal: Optimize Your Signal Analysis Measurements
What happens to the signal of your device once it enters the signal analyzer? This white paper walks through the high-level design of a signal analyzer and how this knowledge can be used to avoid mistakes and make optimum measurements.
RF Testing On Automotive Infotainment Devices
This application note highlights some of the RF measurement challenges and introduces Rohde & Schwarz equipment required for relevant RF characterization of car infotainment devices.