RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

Selecting Your Next Oscilloscope: Why Digital Triggering Matters
Many people tend to overlook the importance of triggering while selecting an oscilloscope, but it's actually a crucial factor to consider. Digital triggering can offer some significant advantages.
Characterizing Parasitic Components In Power Converters
With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.
Power Consumption Analysis With Specialty DC Power Supplies
Optimizing power consumption is critical for IoT devices running on small, non-rechargeable batteries. Learn how accurate characterization and smart design can extend device lifespans.
Ensuring Test Site Compliance for Radiated Emissions With Normalized Site Attenuation
This application note provides a synopsis of Normalized Site Attenuation (NSA) and Reference Site Method measurements which indicate a challenging but important aspect of radiated emissions measurements on an OATS, SAC, or FAR.
Top 5 Strategies For 5G Component Characterization And Test
Component manufacturers need to deploy effective strategies for characterization and test regardless of the component types. This white paper presents five strategies for 5G component characterization and testing.

More Test & Measurement Application Notes and White Papers

TEST & MEASUREMENT SOLUTIONS

Capacitance Meter

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

MXO 5 Series Oscilloscope

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

Extended Frequency Spectrum Analyzer: EVO-RSA-6070A

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

Instantaneous Frequency Measurement Unit: dB-9001

The dB-9001 from dB Control is a custom-mounted Instantaneous Frequency Measurement (IFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

XFdtd Superposition For Advanced Phased Array Design

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

1800 W, 65 V, 1.0 – 1.1 GHz Highest Power GaN Transistor On The Market: QPD1025L

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

GORE® VNA Microwave/RF Test Assemblies

The series of GORE^® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.