TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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RF Amplifier Output Voltage, Current, Power, And Impedance Relationship
How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.
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Ensuring Test Site Compliance for Radiated Emissions With Normalized Site Attenuation
This application note provides a synopsis of Normalized Site Attenuation (NSA) and Reference Site Method measurements which indicate a challenging but important aspect of radiated emissions measurements on an OATS, SAC, or FAR.
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Introduction To RNVNA, A Multiport Network Analysis Solution
In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.
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5G New Radio Over-The-Air Base Station Receiver Tests
This application note describes all mandatory RF receiver tests, according to the Release 16 (V16.3.0). It also offers a brief introduction about the different R&S OA antenna test solutions and how they are applicable for base station conformance testing.
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Field Probe Correction Factors
To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.
TEST & MEASUREMENT NEWS
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