TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • VCO Measurements With FSPN Phase Noise Analyzer

    This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.

  • Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

    Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

  • Top 10 Considerations For Automotive EMC Chamber Design And Testing

    This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

  • Ensuring Test Site Compliance for Radiated Emissions With Normalized Site Attenuation

    This application note provides a synopsis of Normalized Site Attenuation (NSA) and Reference Site Method measurements which indicate a challenging but important aspect of radiated emissions measurements on an OATS, SAC, or FAR.  

  • Small Cell Testing In FR2

    In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.

TEST & MEASUREMENT SOLUTIONS

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

The 50S-2133 SMA from JFW is a solid-state, self-terminating 1P8T RF switch designed for economical automated RF testing applications in the 20 – 5,000 MHz frequency range.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

Holzworth’s multi-channel RF synthesizer architecture is a complete success story. These compact, 1U high, 19in rack mountable chassis can be configured with up to 8 independently tunable channels. All integrated channels are 100% phase coherent. Holzworth has designed the multi-channel platform for integration of our HSM Series Single Channel Synthesizers to maximize channel-to-channel stability via a conductively cooled, fan-less enclosure.

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

Radar simulation systems (i.e., RF sources and/or receivers) must perform to an exacting minimum standard if they are to accurately prove the field worthiness of EW systems.