TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Technical Report: Simulation Of Plasma Materials In XFdtd

  This paper discusses the FDTD method to simulate the behavior of plasma materials using Remcom’s XFdtd 3D EM Simulation Software and presents validation in one and three dimensions.

• Design And Implementation Of A Miniature X-Band Edge-Coupled Microstrip Bandpass Filter

  Microwave bandpass filters are the fundamental component used in many RF/microwave applications to eliminate interference from signals operating at nearby frequencies. This application note presents a straightforward and largely nonmathematical method for designing an edge-coupled, bandpass filter for X-band operations with a combination of filter synthesis, closed-form edge-coupled transmission-line models, and EM analysis using the Microwave Office circuit simulator within Cadence AWR Design Environment software.

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• Solution For BCI Applications

  Rohde & Schwarz provides a compact solution for conducted immunity tests with a signal generator, RF solid-state amplifier up to 350 W, power sensors, and test software for frequencies from 4 kHz to 400 MHz.