TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• EMI Debugging Using Fast FFT With MXO Oscilloscopes

  Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Solving Tomorrow's Obsolescence Challenges Today

  This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.

• Top 10 Considerations For Automotive EMC Chamber Design And Testing

  This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

• eUICC Profile Handling

  This application note describes the eUICC compliance and remote eUICC provisioning test solution based on R&S CMW500/CMW290 and COMPRION eUICC Profile Manager software tool with focus on M2M devices.