TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

TEST & MEASUREMENT SOLUTIONS

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

The RFvision-3 is a tunable ultra-wideband spectrum processing solution designed for 1 GHz bandwidth RF spectrum recording with advanced pulse processing. This rack-mount (3U) system is based on the DTA-9590W ultra-wideband tuner and DTA-5000 RAID server with 24 TB SSDs. It operates from 500 MHz to 18 GHz (expandable up to 40 GHz) and features 100 MHz instantaneous bandwidth.

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.