TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • On-Wafer Characterization At sub-THz Frequencies

    New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

  • Certium VCS Test System For Aircraft Manufacturers

    New aircraft need to have their radiocommunication systems tested with compact voice communication systems like CERTIUM VCS. This is cost-effective, space-saving, and scalable thanks to its IP-based infrastructure.

  • DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

    Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

  • Basic Bulk Current Injection Testing

    Bulk current injection (BCI) testing is a conducted susceptibility procedure that uses an injection current probe. This paper provides an example of BCI testing, covering all steps, including gathering the required equipment, pre-calibration procedures, injection testing procedures, and safety precautions.

  • Battery Cycle Tool For The R&S NGU401/NGU201/NGM200/NGL200

    The battery cycle tool has several charts that display collected data and can be used to characterize battery samples and create battery models.

TEST & MEASUREMENT SOLUTIONS

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

The dB-9004 is a custom-mounted Integrated Antenna Digital Control Unit (IADCU). It operates in the C, X and Ku-band frequency range and provides highly accurate RF output (FM, AM and pulse-shape modulated)

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

The dB-3907 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3907 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.