TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
Application Note: Calculating VNA Measurement Accuracy Vector Network Analyzers (VNA) are your primary resource when analyzing and characterizing systems and components for RF and Microwave measurements. They are regarded as accurate measuring instruments, however, quantifying the accuracy performance of a VNA in a specific application can be challenging. VNA specifications are a starting point; but, they are based upon very specific calibration and measurement conditions, which are not applicable for many applications. The Anritsu Exact Uncertainty program is available to help you obtain the uncertainty data that is appropriate for your specific application.
Low-Cost EMI Pre-Compliance Testing Using A Spectrum Analyzer
This application note provides an overview of EMI compliance testing, pre-compliance testing, and the measurement regulations. It also presents test setups using Tektronix's RSA306 and similar products used to perform both radiated and conducted emission measurements.
Effortless Testing Of Direction Finding Devices – Amplitude Based
Together with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques.
On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
Dual Receiver Measurement
This application note illustrates all necessary settings for performing Dual Receiver Measurement using the R&S®EMC32-K27 option via the R&S® EMC32.