TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Power Supply Control Loop Response Measurements (Bode Plot)

  The R&S^® RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers. 

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

• Four Practical Applications Using An Electronic Load

  This article presents four tips on how to test with electronic loads and illustrate the flexibility and usefulness of a DC electronic load. 

• Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

  The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S^® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.