TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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Navigating Design Complexities With Qorvo's Innovative Software Tools
Unlock the power of Qorvo's Design Hub, providing engineers with cutting-edge RF and analog design tools previously exclusive to Qorvo teams. Streamline your projects with precision and efficiency.
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Field Probe Correction Factors
To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.
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Crowdsourcing Versus Mobile Network Testing
The need for an objective evaluation of mobile network quality and performance drives two fundamentally different approaches, crowdsourcing, and mobile network testing.
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Voltage Standing Wave Ratio (VSWR) Explained
Explore the evolution of VSWR from its humble beginnings in telegraph lines to its vital role in modern RF engineering, illuminating its practical applications and underlying principles.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions