TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• How To Perform A Radiated Emissions Measurement

  Explore the intricacies of setting up radiated emissions testing with this guide, covering everything from antenna placement and polarization to accurate frequency selection and signal measurement.

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Waveform Acquisition Rate And Why It Matters

  Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.

• EMC32 To R&S ELEKTRA Migration Using The ELEKTRA Migration Tool

  Discover how to use the R&S ELEKTRA Migration Tool for converting the backup data into the XML format that can be interpreted by the R&S ELEKTRA software.