TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz
Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.
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Telecommunications Testing Using AR Amplifiers
This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.
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Design Of A Complete RF Downconverter Module For Test Equipment
The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.
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Accurately Measure Your UWB Device's Time Of Flight
The R&S®CMP200 radio communication tester together with the R&S®CM-Z300A time of flight kit provides an accurate setup for time of flight measurements – in validation, calibration and certification.
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VSWR Conversion To Reflected Power
VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
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- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
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