TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

    The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

  • Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz

    Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.

  • Circuit Models For Plastic Packaged Microwave Diodes

    This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

  • Simplify Coexistence And Interference Testing For GNSS Receivers

    The R&S®SMW200A GNSS simulator offers an easy and convenient way to test your receiver design against a wide variety of potential interferers and jammers. Test cases extend from simple coexistence simulations to complex interference scenarios with localized emitters.

  • Verifying The Clock Source

    In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

TEST & MEASUREMENT SOLUTIONS

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

The dB-3907 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3907 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

Holzworth’s multi-channel RF synthesizer architecture is a complete success story. These compact, 1U high, 19in rack mountable chassis can be configured with up to 8 independently tunable channels. All integrated channels are 100% phase coherent. Holzworth has designed the multi-channel platform for integration of our HSM Series Single Channel Synthesizers to maximize channel-to-channel stability via a conductively cooled, fan-less enclosure.

The 50S-2133 SMA from JFW is a solid-state, self-terminating 1P8T RF switch designed for economical automated RF testing applications in the 20 – 5,000 MHz frequency range.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.