TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Design And Implementation Of A Miniature X-Band Edge-Coupled Microstrip Bandpass Filter

  Microwave bandpass filters are the fundamental component used in many RF/microwave applications to eliminate interference from signals operating at nearby frequencies. This application note presents a straightforward and largely nonmathematical method for designing an edge-coupled, bandpass filter for X-band operations with a combination of filter synthesis, closed-form edge-coupled transmission-line models, and EM analysis using the Microwave Office circuit simulator within Cadence AWR Design Environment software.

• Technical Report: Simulation Of Plasma Materials In XFdtd

  This paper discusses the FDTD method to simulate the behavior of plasma materials using Remcom’s XFdtd 3D EM Simulation Software and presents validation in one and three dimensions.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Speeding Up Reflection Measurements On Antenna Systems

  Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

• Certium VCS Test System For Aircraft Manufacturers

  New aircraft need to have their radiocommunication systems tested with compact voice communication systems like CERTIUM VCS. This is cost-effective, space-saving, and scalable thanks to its IP-based infrastructure.