TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Solving Tomorrow's Obsolescence Challenges Today
This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.
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S-Parameters For High-frequency Circuit Simulations
Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.
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R&S®FSWP And The Validity Of Positive Phase Noise Values
This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.
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Load Transient Response – Enhancing Loop Stability Testing
Ensuring stability in power supply design requires validating switching converter stability through frequency loop and load transient responses, aided by modern oscilloscopes for visualizing PWM signals and identifying converter effects.
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Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz
Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions