TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Testing A 24-28GHz Power Amplifier Using The 5G New Radio Test Standard

    In this white paper, we will introduce some of the main challenges in test and measurement of a device at mmWave frequencies, with a 26 GHz pioneer band defined for the UK between 24.25 - 27.5 GHz.

  • EMI Debugging Using Fast FFT With MXO Oscilloscopes

    Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.

  • RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

    How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

  • VSWR Conversion To Reflected Power

    VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.

  • R&S®FSWP And The Validity Of Positive Phase Noise Values

    This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.

TEST & MEASUREMENT SOLUTIONS

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

Holzworth’s multi-channel RF synthesizer architecture is a complete success story. These compact, 1U high, 19in rack mountable chassis can be configured with up to 8 independently tunable channels. All integrated channels are 100% phase coherent. Holzworth has designed the multi-channel platform for integration of our HSM Series Single Channel Synthesizers to maximize channel-to-channel stability via a conductively cooled, fan-less enclosure.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

The Si894x is a galvanically isolated delta-sigma modulator which outputs a digital signal proportional to the voltage level at the input. 

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.