TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Field Probe Correction Factors
To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.
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Combining On-Wafer VNA And Spectrum Analyzer Measurements
This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.
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Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces
In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.
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How To Test USB Power Delivery Over Type-C
USB Type-C compliance test standards are more complex due to higher data transmission speeds and more power. Successful testing requires accurate and compliant test instruments, software, and fixtures.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions