TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Waveform Acquisition Rate And Why It Matters

  Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.

• Field Probe Correction Factors

  To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.

• Mastering O-RAN Radio Unit (O-RU) Testing

  How Kyrio found its perfect O-RAN conformance T&M solution from Rohde & Schwarz and VIAVI Solutions.
• EMC32 To R&S ELEKTRA Migration Using The ELEKTRA Migration Tool

  Discover how to use the R&S ELEKTRA Migration Tool for converting the backup data into the XML format that can be interpreted by the R&S ELEKTRA software.

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.