TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Design Of A Complete RF Downconverter Module For Test Equipment

   The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Crowdsourcing Versus Mobile Network Testing

  The need for an objective evaluation of mobile network quality and performance drives two fundamentally different approaches, crowdsourcing, and mobile network testing.

• R&S®FSWP And The Validity Of Positive Phase Noise Values

  This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.

• How To Configure Generic Devices In R&S Elektra

  R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.