TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Navigating Design Complexities With Qorvo's Innovative Software Tools

  Unlock the power of Qorvo's Design Hub, providing engineers with cutting-edge RF and analog design tools previously exclusive to Qorvo teams. Streamline your projects with precision and efficiency.

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

• Small Cell Testing In FR2

  In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.

• Battery Simulation With DC Power Supplies

  This application note guides users in creating custom battery models for R&S^® NGM200 and R&S^® NGU201 power supplies, enabling gradual battery discharge via QuickArb and data logging, with recorded data adaptable for battery simulation using a provided developer tool.