TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Combining On-Wafer VNA And Spectrum Analyzer Measurements

  This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.

• Verifying The Clock Source

  In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

• An Introduction To Direction Finding Methodologies

  All direction finding methodologies are meant to determine the physical or geographical location of a source of radio frequency energy. The choice of an appropriate direction finding methodology to use for a given application is largely a function of the target signal's characteristics, such as frequency and modulation, but is also influenced by the propagation environment as well as cost and complexity.  Recent advances in the development of hybrid direction finding methodologies attempt to overcome some of these restrictions and increase accuracy by using a combination of methodologies.

• Making Higher Accuracy Oscilloscope Measurements

  One of the most important functional blocks in a digital oscilloscope is the analog-to-digital converter or ADC. This white paper explains why ADC resolution has become a more important consideration in oscilloscopes, especially for measuring small signal details.