TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Solving Tomorrow's Obsolescence Challenges Today

  This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.

• Accurate Test Fixture Characterization And De-Embedding

  This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

• Speeding Up Reflection Measurements On Antenna Systems

  Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

• Battery Simulation With DC Power Supplies

  This application note guides users in creating custom battery models for R&S^® NGM200 and R&S^® NGU201 power supplies, enabling gradual battery discharge via QuickArb and data logging, with recorded data adaptable for battery simulation using a provided developer tool.