TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Optimizing WLAN Test Systems For Measurement Speed: Four Ways To Reduce Measurement Time By National Instruments Corporation With increasing pressure to lower test costs, many RF test engineers face the challenge of reducing measurement time. As you might expect, wireless LAN (WLAN) device testing is no exception. Whether you are creating an automated test system for design validation or final production test, it has become increasingly important to optimize a test system for measurement speed.
• Evaluating Exposure To Pulsed Magnetic Fields With The ELT-400 Tester

  Narda's ELT-400 Tester is designed for measuring low frequency magnetic fields and evaluating the field exposure that occurs in workplaces and in public areas. This application note discusses the possibilities for ELT-400 analysis.

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• Power Consumption Analysis With Specialty DC Power Supplies

  Optimizing power consumption is critical for IoT devices running on small, non-rechargeable batteries. Learn how accurate characterization and smart design can extend device lifespans.