TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

    Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

  • Electronic Packaging: Using EMI Material-Based Solutions

    It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

  • VSWR Conversion To Reflected Power

    VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.

  • RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

    How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

  • Top 5 Strategies For 5G Component Characterization And Test

    Component manufacturers need to deploy effective strategies for characterization and test regardless of the component types. This white paper presents five strategies for 5G component characterization and testing.

TEST & MEASUREMENT SOLUTIONS

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

The dB-9001 from dB Control is a custom-mounted Instantaneous Frequency Measurement (IFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Qorvo offers the CMD240C4 wideband GaAs MMIC distributed amplifier housed in a leadless 4x4 mm surface mount package. The amplifier operates from DC to 22 GHz and is ideal for radar, space, satcom, test and measurement, and electronic warfare applications.

The dB-3906 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3906 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.