TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Selecting Your Next Oscilloscope: Why Digital Triggering Matters
Many people tend to overlook the importance of triggering while selecting an oscilloscope, but it's actually a crucial factor to consider. Digital triggering can offer some significant advantages.
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R&S®FSWP And The Validity Of Positive Phase Noise Values
This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.
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Accurate Test Fixture Characterization And De-Embedding
This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.
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EMI Debugging Using Fast FFT With MXO Oscilloscopes
Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.
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Characterizing Parasitic Components In Power Converters
With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions