TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• The Journey Of A Signal: Optimize Your Signal Analysis Measurements

  What happens to the signal of your device once it enters the signal analyzer? This white paper walks through the high-level design of a signal analyzer and how this knowledge can be used to avoid mistakes and make optimum measurements.

• Performing Differential Noise Figure Measurements

  In recent years, numerous improvements have been made in noise figure measurements through better algorithmic understanding of the measurements, more sensitive receivers, and less error-prone methods of processing noise power measurements. Anritsu has incorporated a number of these improvements in the single-ended Noise Figure Measurement Option of the VectorStar vector network analyzer (VNA) platform. This application note offers insights into and examples of performing differential noise figure measurements.

• An Introduction To Direction Finding Methodologies

  All direction finding methodologies are meant to determine the physical or geographical location of a source of radio frequency energy. The choice of an appropriate direction finding methodology to use for a given application is largely a function of the target signal's characteristics, such as frequency and modulation, but is also influenced by the propagation environment as well as cost and complexity.  Recent advances in the development of hybrid direction finding methodologies attempt to overcome some of these restrictions and increase accuracy by using a combination of methodologies.

• Breakdown And Leakage Current Measurements On High Voltage Semiconductor Device

  Coupling a Keithley SourceMeter SMU instrument like the 2470, KickStart software, and their associated accessories meets all test needs and further facilitates research of high voltage materials and semiconductor devices.

• Telecommunications Testing Using AR Amplifiers

  This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.