TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Four Practical Applications Using An Electronic Load
This article presents four tips on how to test with electronic loads and illustrate the flexibility and usefulness of a DC electronic load.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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DPX® Acquisition Technology For Spectrum Analyzers Fundamentals
Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.
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An Introduction To Direction Finding Methodologies
All direction finding methodologies are meant to determine the physical or geographical location of a source of radio frequency energy. The choice of an appropriate direction finding methodology to use for a given application is largely a function of the target signal's characteristics, such as frequency and modulation, but is also influenced by the propagation environment as well as cost and complexity. Recent advances in the development of hybrid direction finding methodologies attempt to overcome some of these restrictions and increase accuracy by using a combination of methodologies.
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eUICC Profile Handling
This application note describes the eUICC compliance and remote eUICC provisioning test solution based on R&S CMW500/CMW290 and COMPRION eUICC Profile Manager software tool with focus on M2M devices.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions