TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Harmonic Measurement For IEC 61000-4-3 And Other Radiated Immunity Standards

    Amplifiers exhibiting significant harmonic distortion in immunity test systems can exhibit broadband characteristics that result in measurement uncertainty and unacceptable errors. This app note addresses acceptable harmonic measurement standards and other radiated immunity standards.

  • Solving Tomorrow's Obsolescence Challenges Today

    This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.

  • Selecting Your Next Oscilloscope: Why Digital Triggering Matters

    Many people tend to overlook the importance of triggering while selecting an oscilloscope, but it's actually a crucial factor to consider. Digital triggering can offer some significant advantages.

  • eUICC Profile Handling

    This application note describes the eUICC compliance and remote eUICC provisioning test solution based on R&S CMW500/CMW290 and COMPRION eUICC Profile Manager software tool with focus on M2M devices.

  • Simplify Coexistence And Interference Testing For GNSS Receivers

    The R&S®SMW200A GNSS simulator offers an easy and convenient way to test your receiver design against a wide variety of potential interferers and jammers. Test cases extend from simple coexistence simulations to complex interference scenarios with localized emitters.

TEST & MEASUREMENT SOLUTIONS

The A.H. Systems' line of Current Probe Calibration Fixtures are a great way to keep your broadband Current Probes, and Injection Current Probes calibrated and up to date. Their rugged design ensures long life, and faultless operation over the wide calibration frequency range of 10 kHz to 1000 MHz.

Qorvo introduces the QPC2040 single-pole, double-throw (SPDT) switch operating within the 8 – 12 GHz frequency range for commercial and military radar, communications, electronic warfare, test instrumentation, and other general purpose applications. The switch typically supports 10 W input power handling at control voltages of 0/−2 V for both CW and pulsed RF operations.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

The dB-9003 and dB-9005 from dB Control are custom-mounted Integrated Stabilized RF Sources (ISRFS) designed to operate in the I and Ka-band frequency range. Both products feature high accuracy and a wide temperature operating range. They can be controlled and set up with a digital port. The units are packaged in a custom configuration with conduction cooling.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.