TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• Speeding Up Reflection Measurements On Antenna Systems

  Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

• Load Transient Response – Enhancing Loop Stability Testing

  Ensuring stability in power supply design requires validating switching converter stability through frequency loop and load transient responses, aided by modern oscilloscopes for visualizing PWM signals and identifying converter effects.

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz

  Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.