TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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RF Amplifier Output Voltage, Current, Power, And Impedance Relationship
How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.
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VCO Measurements With FSPN Phase Noise Analyzer
This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.
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Telecommunications Testing Using AR Amplifiers
This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.
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De-Embedding Test Fixtures For High-Speed Digital Applications
Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.
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Electronic Packaging: Using EMI Material-Based Solutions
It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions