TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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S-Parameters For High-frequency Circuit Simulations
Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.
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Reduce Risk With A Better Measurement Process
Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.
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Electronic Packaging: Using EMI Material-Based Solutions
It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.
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Verifying The Clock Source
In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.
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How To Test USB Power Delivery Over Type-C
USB Type-C compliance test standards are more complex due to higher data transmission speeds and more power. Successful testing requires accurate and compliant test instruments, software, and fixtures.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions