TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

• Introduction To RNVNA, A Multiport Network Analysis Solution

  In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Radiated Wireless Coexistence Testing

  This application notegives the reader a clear idea of how to configure standardized test instruments from R&S in order to generate the wanted signal as well as unintended interference signals and conduct measurement to monitor device performance.