TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • How To Configure Generic Devices In R&S Elektra

    R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

  • Characterizing Parasitic Components In Power Converters

    With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

  • Transmit And Receive Testing Of Digital Waveforms Using R&S®CMA180

    The compact R&S®CMA180 Radio Test Set allows straightforward tests on devices that use analog or digital modulation and demodulation formats. This application note focuses on the use of the digital radio capabilities for measurements on radio transceiving devices in terms of their functionality and parameter characterization. Also shown is how to use the instrument with the various software tools available from Rohde & Schwarz for creating and evaluating digitally modulated signals.

  • Introduction To RNVNA, A Multiport Network Analysis Solution

    In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.

  • Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

    The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

TEST & MEASUREMENT SOLUTIONS

The dB-3907 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3907 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

The dB-3906 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3906 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

Pentek offers the Talon® RTX 2684 as a 26 GHz sentinel intelligent signal scanner recording system. The system provides SIGINT engineers the ability to scan the RF spectrum from 1 GHz to 26 GHz for signals of interest and monitor or record bandwidths up to 500 MHz wide.