TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• R&S®FSWP And The Validity Of Positive Phase Noise Values

  This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.

• Understanding Component EMC Testing for ICs

  If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

• De-Embedding Test Fixtures For High-Speed Digital Applications

  Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

• Compact Solution For Network Analysis In The mmWave Range

  The R&S^® ZNA vector network analyzer with integrated LO output and direct IF input options is a simple, cost-effective solution for 2-port and 4-port measurements using Rohde & Schwarz mmWave converters.

• Design And Implementation Of A Miniature X-Band Edge-Coupled Microstrip Bandpass Filter

  Microwave bandpass filters are the fundamental component used in many RF/microwave applications to eliminate interference from signals operating at nearby frequencies. This application note presents a straightforward and largely nonmathematical method for designing an edge-coupled, bandpass filter for X-band operations with a combination of filter synthesis, closed-form edge-coupled transmission-line models, and EM analysis using the Microwave Office circuit simulator within Cadence AWR Design Environment software.