RF Test And Measurement Resource Center

TEST AND MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Differential Measurements with Spectrum Analyzers and Probes

  RF circuit designs typically require measurements at many stages in a signal path. As components continue to decrease in size, and with board space at a premium, it has become even more challenging to integrate adequate test connection for RF instruments.

• R&S Time Code Inserter: Time Code-Based A/V Distortion Analysis

  This application note describes how time codes work and how to add a time code to any A/V file.

• Applying Error Correction To Vector Network Analyzer Measurements

  Imperfections in instruments can cause measurement errors that are displayed as considerable loss and ripple in the collected data. This app note covers multiple calibration procedures for the correction of such errors, and their effectiveness is illustrated with the measurement of high-frequency components. 

• Dual Receiver Measurement

  This application note illustrates all necessary settings for performing Dual Receiver Measurement using the R&S®EMC32-K27 option via the R&S® EMC32.

• Is An ASIC Right For Your Next IoT Product?

  Application specific integrated circuits (ASICs) have become much cheaper and more flexible over the years, offering many more capabilities and significant benefits for a wider range of applications. So how do you know if using an ASIC is ideal for your application? 

• Fast and Accurate Passive Intermodulation (PIM) Measurements
• Application Note: Calculating VNA Measurement Accuracy
• Optimizing Performance And Cost For Millimeter-Wave Signal Analysis
• Specifying RF/Microwave Power Amplifiers for EMC Testing – HIRF And High Frequency Field Generating Systems
• Modern Architecture Advances Vector Network Analyzer Performance