TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Waveform Acquisition Rate And Why It Matters
Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.
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Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces
In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.
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Load Transient Response – Enhancing Loop Stability Testing
Ensuring stability in power supply design requires validating switching converter stability through frequency loop and load transient responses, aided by modern oscilloscopes for visualizing PWM signals and identifying converter effects.
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Top 5 Strategies For 5G Component Characterization And Test
Component manufacturers need to deploy effective strategies for characterization and test regardless of the component types. This white paper presents five strategies for 5G component characterization and testing.
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DPX® Acquisition Technology For Spectrum Analyzers Fundamentals
Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions