TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Design Of A Complete RF Downconverter Module For Test Equipment

     The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.

  • Accurately Measure Your UWB Device's Time Of Flight

    The R&S®CMP200 radio communication tester together with the R&S®CM-Z300A time of flight kit provides an accurate setup for time of flight measurements – in validation, calibration and certification.

  • 5G New Radio Over-The-Air Base Station Receiver Tests

    This application note describes all mandatory RF receiver tests, according to the Release 16 (V16.3.0). It also offers a brief introduction about the different R&S OA antenna test solutions and how they are applicable for base station conformance testing.

  • Small Cell Testing In FR2

    In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.

  • Telecommunications Testing Using AR Amplifiers

    This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.

TEST & MEASUREMENT SOLUTIONS

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

The 50S-2133 SMA from JFW is a solid-state, self-terminating 1P8T RF switch designed for economical automated RF testing applications in the 20 – 5,000 MHz frequency range.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

The Si894x is a galvanically isolated delta-sigma modulator which outputs a digital signal proportional to the voltage level at the input.