TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • How To Configure Generic Devices In R&S Elektra

    R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

  • Reduce Risk With A Better Measurement Process

    Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

  • Solution For BCI Applications

    Rohde & Schwarz provides a compact solution for conducted immunity tests with a signal generator, RF solid-state amplifier up to 350 W, power sensors, and test software for frequencies from 4 kHz to 400 MHz.

  • Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

    Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

  • Field Probe Correction Factors

    To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.

TEST & MEASUREMENT SOLUTIONS

Qorvo introduces the QPC2040 single-pole, double-throw (SPDT) switch operating within the 8 – 12 GHz frequency range for commercial and military radar, communications, electronic warfare, test instrumentation, and other general purpose applications. The switch typically supports 10 W input power handling at control voltages of 0/−2 V for both CW and pulsed RF operations.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

The Model 6350S is a small form factor 8-channel A/D & D/A subsystem designed for a variety of applications including high-bandwidth data streaming, waveform signal generators, multimode data acquisition, and other electronic warfare systems. Designed to be integrated into larger systems with minimal design effort, the 6350S delivers the performance and high-channel density of RFSoC in a small, convenient footprint.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

Radar simulation systems (i.e., RF sources and/or receivers) must perform to an exacting minimum standard if they are to accurately prove the field worthiness of EW systems.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer