RF Test And Measurement Resource Center
TEST AND MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
Differential Measurements with Spectrum Analyzers and Probes
RF circuit designs typically require measurements at many stages in a signal path. As components continue to decrease in size, and with board space at a premium, it has become even more challenging to integrate adequate test connection for RF instruments.
R&S Time Code Inserter: Time Code-Based A/V Distortion Analysis
This application note describes how time codes work and how to add a time code to any A/V file.
Applying Error Correction To Vector Network Analyzer Measurements
Imperfections in instruments can cause measurement errors that are displayed as considerable loss and ripple in the collected data. This app note covers multiple calibration procedures for the correction of such errors, and their effectiveness is illustrated with the measurement of high-frequency components.
Dual Receiver Measurement
This application note illustrates all necessary settings for performing Dual Receiver Measurement using the R&S®EMC32-K27 option via the R&S® EMC32.
Is An ASIC Right For Your Next IoT Product?
Application specific integrated circuits (ASICs) have become much cheaper and more flexible over the years, offering many more capabilities and significant benefits for a wider range of applications. So how do you know if using an ASIC is ideal for your application?