TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Solution For BCI Applications

  Rohde & Schwarz provides a compact solution for conducted immunity tests with a signal generator, RF solid-state amplifier up to 350 W, power sensors, and test software for frequencies from 4 kHz to 400 MHz.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• How To Test USB Power Delivery Over Type-C

  USB Type-C compliance test standards are more complex due to higher data transmission speeds and more power. Successful testing requires accurate and compliant test instruments, software, and fixtures.

• Harmonic Measurement For IEC 61000-4-3 And Other Radiated Immunity Standards

  Amplifiers exhibiting significant harmonic distortion in immunity test systems can exhibit broadband characteristics that result in measurement uncertainty and unacceptable errors. This app note addresses acceptable harmonic measurement standards and other radiated immunity standards.