Laminates

PRODUCTS AND SERVICES

The HLM-20PSM is a high-power GaAs Schottky diode signal limiter featuring high IP3 over a broad DC - 20GHz bandwidth. 

A 4.2mm2 six-lead SOT-363 package is available with the same outside dimension of the SOT-323 three-lead package

The QPC0045 is an ultra-wideband SOI 6-bit digital step attenuator (DSA). It operates over 0.01 to 48 GHz and provides a 31.5 dB attenuation range with a LSB of 0.5 dB. It also achieves a low step error of less than 0.1 dB typically.

The dB-3774B is a pulsed microwave power module (MPM) operating in the 6 to 18 GHz frequency range. It provides 1 kW peak power at 5% maximum duty cycle and is designed for high-performance electronic warfare applications. A periodic permanent magnet (PPM)-focused, conduction-cooled mini traveling wave tube (TWT) is used for power amplification.

Qorvo's QPD2025D is a discrete 250-micron pHEMT which operates from DC to 20 GHz. The QPD2025D is designed using Qorvo's proven standard 0.25um power pHEMT production process. 

The FL8000 and MP Series for Field Monitoring and Probes by AR offers a three-in-one solution used for measuring continuous-wave, pulsed, and modulated electric fields. Applications for the FL8000 Series include commercial, automotive, military, and aviation. This series offers exceptional linearity and dynamic range performance, enabling the accuracy required for demanding testing. With fiber power connectivity, the FL8000 Series provides an easy migration path, while delivering the reliability that AR is known for.

Skyworks offers the SKYFR-001982 single-junction, surface-mount circulator designed for radar and power amplifier applications. It is designed to operate over the 1200 MHz to 1400 MHz with an operating temperature range of -40 °C to +85 °C.

The Model 2810 Vector Signal Analyzer (VSA) from Keithley Instruments allows manufacturers of mobile phones, mobile radios, cordless phones, wireless sensors, and other industrial/medical telemetry products to reduce their test times, capital equipment costs, and test system development time significantly over current technology...