The X-MWsystem from X-Microwave is a complete modular building block eco-system including a broad offering of RF and microwave components, an innovative Prototype Station and a FREE online System Simulator. The X-MWsystem can be used to seamlessly navigate thru the product development process from simulation to prototype to production hardware.
The Video Inspection Probe Lite (VIP Lite) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions. With today’s high data rate, high definition services, connector quality and inspection have never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.
Schmid and Partner Engineering’s line of Time Domain Sensor (TDS) probes are used to detect EMC/EMI, MRI, and antenna measurements.
Pasternack offers a new line of semi-rigid coaxial test probes designed specifically for assisting in testing microwave circuits. These probes can be used to make sampling measurements without creating a separate subassembly circuit board or adding a connector to the circuit layout. Available in three different diameters of semi-rigid coax, and 3, 6, 9, or 12 inch lengths, these cable assemblies can fit a variety of trace widths and applications.
These E-field laser probes contain an internal microprocessor that enables them to "think" for themselves and adapt to their environment. This provides optimal linearization, temperature compensation, control, and communication functions. AR's six E&H field probes cover the range from 100 kHz - 60 GHz, 0.4 to 1,000 V/m, 0.012 to 17 A/m.
The FL8000 and MP Series for Field Monitoring and Probes by AR offers a three-in-one solution used for measuring continuous-wave, pulsed, and modulated electric fields. Applications for the FL8000 Series include commercial, automotive, military, and aviation. This series offers exceptional linearity and dynamic range performance, enabling the accuracy required for demanding testing. With fiber power connectivity, the FL8000 Series provides an easy migration path, while delivering the reliability that AR is known for.
A.H. Systems offers Current Probe devices designed to be used in generating and measuring high levels of RF current, and in many industrial and scientific applications. They can be used to measure conducted currents without making direct contact with the source conductor or metallic surface.
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