The Video Inspection Probe Lite (VIP Lite) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions. With today’s high data rate, high definition services, connector quality and inspection have never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.
A.H. Systems offers Current Probe devices designed to be used in generating and measuring high levels of RF current, and in many industrial and scientific applications. They can be used to measure conducted currents without making direct contact with the source conductor or metallic surface.