A.H. Systems offers Current Probe devices designed to be used in generating and measuring high levels of RF current, and in many industrial and scientific applications. They can be used to measure conducted currents without making direct contact with the source conductor or metallic surface.
The FL7006 is a smart, fast, extremely accurate electric field probe that contains an internal microprocessor to provide linearization, temperature compensation, control, and communication functions.
Schmid and Partner Engineering’s line of Time Domain Sensor (TDS) probes are used to detect EMC/EMI, MRI, and antenna measurements.
The Video Inspection Probe Lite (VIP Lite) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions. With today’s high data rate, high definition services, connector quality and inspection have never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.
The X-MWsystem from X-Microwave is a complete modular building block eco-system including a broad offering of RF and microwave components, an innovative Prototype Station and a FREE online System Simulator. The X-MWsystem can be used to seamlessly navigate thru the product development process from simulation to prototype to production hardware.
These E-field laser probes contain an internal microprocessor that enables them to "think" for themselves and adapt to their environment. This provides optimal linearization, temperature compensation, control, and communication functions. AR's six E&H field probes cover the range from 100 kHz - 60 GHz, 0.4 to 1,000 V/m, 0.012 to 17 A/m.
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