TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis
The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.
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Technical Report: Simulation Of Plasma Materials In XFdtd
This paper discusses the FDTD method to simulate the behavior of plasma materials using Remcom’s XFdtd 3D EM Simulation Software and presents validation in one and three dimensions.
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Power Supply Control Loop Response Measurements (Bode Plot)
The R&S® RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers.
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VSWR Conversion To Reflected Power
VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.
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How To Configure Generic Devices In R&S Elektra
R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions