Test And Measurement Products

  1. Fast, Low-Noise Digital Signal Generator: SGD
    11/29/2011
    Aeroflex's SGD is a fast, low noise digital signal generator and is part of the Aeroflex S-Series of products. This generator is ideal for demanding, critical receiver measurement and rapid manufacturing, or for general purpose applications. It covers the 100 kHz to 6 GHz frequency range, features a fast settling time of 100 µs, and has a +13 dBm output with a +20 dBm option. Users have the option to design waveform files from simple generic or system specific templates as well as convert user designed waveforms into compatible formats with an embedded version of of IQCreator®, Aeroflex's powerful waveform creation tool. Waveforms designed in IQCreator® can include signal impairments and time markers to aid sychronization. Graphical displays of the waveform FFT, vector and constellation diagrams, etc. can be viewed and exported for use in other Windows™ applications.
  2. Speed Sensor Heads: SSS Series
    4/6/2013

    These speed sensor heads feature low harmonic emission, low flick noise, high sensitivity, CW and pulse mode operation, FCC part 15 compliance, and more. They’re available with various different antenna types, making them versatile for various applications.

  3. Faster Failure Detection Capabilities With R&S TS7124 RF Shielded Box And R&S CMW100 Test Set
    3/1/2016

    Rohde & Schwarz has combined the R&S TS7124 RF shielded box and R&S CMW100 test set to offer a compact, flexible turnkey solution for quickly and reliably detecting antenna failures in production. This solution is designed to provide accurate measurements while reducing manufacturing line test time for all production test cases including calibration, verification, and functional tests.

  4. Chip Scale Package EMI/RFI Filter Arrays
    9/28/2000
    The WLP200 is an evaluation RC filter network suited for mobile equipment. The device consists of 6 channel RC filters with different...
  5. RealProbe VEC-102
    10/6/2004
    The RealProbe VEC-102 is an in-circuit, high-accuracy RF probe covering the 10-7000 MHz frequency range...
  6. 20 Channel Digital Delay Generator with 5 Picosecond Jitter: Model 745T-20C
    3/22/2014

    As its model number implies, the 745T-20C is a digital delay generator with 20 channels in one unit. It features a 100 ps time resolution (standard, with an optional 250 fs time resolution), 5 ps jitter (internal trigger), a 25 ps jitter (external trigger), 1 ns output rise times, and more.

  7. Vector Signal Analyzer: SVA
    11/29/2011
    The SVA Vector Signal Generator is part of the Aeroflex S-Series of products. This signal generator converts RF signals into digital IF or I&Q sampled data providing vector signal analysis of RF signals with functionality and performance required in the laboratory or the manufacturing test system. The SVA is ideal for applications involving the of WLAN, WMAN, WPAN, 2G, 3G, 4G cellular radio signals as well as general purpose analog and digitally modulated signal analysis due to its high linearity, low noise, and excellent level accuracy.
  8. In-Vehicle eCall Test Solution
    2/26/2014

    In-vehicle systems (IVS) are designed to connect to a public safety answering point when an automobile is an accident. They transmit a minimum set of data to emergency personnel that includes the vehicle’s GPS coordinates. Rohde & Schwarz recently developed a setup for manufacturers of these automatic in-vehicle systems (IVS) for reliability testing.  

  9. Low Noise Synthesizer: LNS-18
    9/12/2012

    The LNS-18 Low Noise Synthesizer is ideal for use as a signal source for driving up- and down-converters in military, space, and other applications where phase noise is critical. This is due to the fact that this particular synthesizer features the lowest phase noise of any product like it on the market today.

  10. VersiCal Calibration Software
    2/10/2009
    The new Modelithics VersiCal™ calibration software enables accurate broad-band vector network analyzer “cSOLT” and “cSOLR” calibrations using more complex modeling of lumped standards.