Featured Articles
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How Do You Determine Whether A Connector Is Within Tolerance?
7/9/2026
Learn how connector gage kits verify pin depth, identify out-of-tolerance connectors, and help prevent measurement errors, unreliable connections, and costly equipment damage.
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How Do You Control Impedance With A Slide-Screw Tuner?
7/9/2026
Learn how slide-screw impedance tuners vary magnitude and phase to present nearly any load, enabling accurate RF device characterization beyond standard 50 Ω conditions.
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How Can You Identify the Right RF Connector For Your Test Setup?
7/9/2026
Avoid costly RF connector mismates by learning how to identify compatible interfaces and use color coding to improve accuracy and protect test equipment.
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What Causes Time-Varying Propagation Delay In Satellite Links?
7/9/2026
Learn why propagation delay changes during LEO and MEO satellite passes and how accurate emulation improves the realism of NTN system testing.
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Does This Connector Look Right To You? What To Check Before Use
7/9/2026
A simple connector inspection can prevent measurement errors and equipment damage. Learn the three critical signs to check before every RF connection.
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How Does Doppler Shift Affect Signals During A Satellite Pass?
7/9/2026
Discover how Doppler shift changes throughout a satellite pass, why it challenges NTN receiver performance, and how realistic channel emulation enables accurate pre-deployment testing.
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MT2000: High‑Power (1 kW) Harmonic Load Pull For GaN Devices
7/9/2026
Learn how the MT2000 enables accurate 1 kW GaN harmonic load pull measurements using hybrid impedance synthesis for faster, safer, and more efficient amplifier characterization.
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MT2000: Unlocking PA Efficiency Through 3rd Harmonic Load Pull
7/9/2026
Discover how third harmonic load pull improves GaN power amplifier efficiency, enabling faster characterization, better models, and optimized RF performance with the MT2000.
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Testing Regenerative And Transparent 5G NTN Architectures With The ACE9600
7/9/2026
Learn how the ACE9600 emulates dynamic 5G NTN satellite channels to validate regenerative and transparent architectures before deployment with realistic, repeatable laboratory testing.
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MT2000: Double Pulse Load Pull For Trapping Characterization Of GaN Transistors
7/9/2026
RF Double Pulse Load Pull on the MT2000 reveals GaN transistor trapping effects, enabling accurate characterization of dynamic performance, model validation, and power amplifier optimization.