Application Note

RF/Microwave DUT De-embedding

When analyzing a complex RF signal, characterizing a fast clock, or debugging a high-speed interface, it is important to observe the real signal and not artifacts of the test setup like loading or reflections. The process of removing non-ideal signal path effects is called de-embedding. This application note describes how to perform high-precision RF and microwave tests requiring de-embedding. Download the full paper for more information.

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