On-Wafer Qualification Of RF Components

Characterizing a device under test (DUT) at the wafer level requires a measurement system including a vector network analyzer (VNA), a probe station, cables/adapters and wafer probes. Rohde & Schwarz is collaborating with FormFactor to address wafer-level testing. This has led to a combined solution with Rohde & Schwarz supplying the VNA, which is a powerful one-box tester measuring all RF qualification parameters, no matter whether coaxial or waveguide adapters are used. Download the full application note to learn more.