The Octane Elite EDS System from EDAX Inc. incorporates a silicon nitride (Si3N4) window to provide low energy sensitivity for light element detection and low kV microanalysis. The system uses state of the art electronics designed to yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.
The Octane Elite SSDs feature a motorized slide that offers full control of the detector via the software and is optimal for analytical flexibility and for all Focused Ion Beam (FIB) systems. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors. The included silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst.
Additional features include:
For additional features and specifications, download the available datasheet.