Octane Elite EDS System

Source: EDAX, Inc.

Octane Elite EDS System

The Octane Elite EDS System from EDAX Inc. incorporates a silicon nitride (Si3N4) window to provide low energy sensitivity for light element detection and low kV microanalysis. The system uses state of the art electronics designed to yield high speed X-ray data processing within a smaller and fully vacuum encapsulated detector device.

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The Octane Elite SSDs feature a motorized slide that offers full control of the detector via the software and is optimal for analytical flexibility and for all Focused Ion Beam (FIB) systems. They can be combined with one of EDAX’s Electron Backscatter Diffraction (EBSD) cameras and/or Wavelength Dispersive Spectrometry (WDS) detectors. The included silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst.

Additional features include:

  • Fast pulse processing from mapping and quantification
  • Optimized data quality at all count rates
  • High resolution quantitative analysis at mapping speeds greater than 400,000 output cps
  • Smart Diagnostics and Smart Acquisition facilitate optimized collection and analysis conditions
  • Smart Pulse Pile-Up Correction minimizes concerns typical of high count rate collections

For additional features and specifications, download the available datasheet.