Octane Elite EDS System Datasheet
Source: EDAX, Inc.
The Octane Elite EDS System from EDAX Inc. incorporates a silicon nitride (Si3N4) window to provide low energy sensitivity for light element detection and low kV microanalysis. The included silicon nitride window offers major improvements compared to a polymer window, leading to greatly improved light element performance and significantly more critical data for the analyst. For additional features and specifications, download the available datasheet.
access the Datasheet!
Log In
Get unlimited access to:
Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue.
X
Enter your credentials below to log in. Not yet a member of RF Globalnet? Subscribe today.
Subscribe to RF Globalnet
X
Subscribe to RF Globalnet
This website uses cookies to ensure you get the best experience on our website. Learn more