Mastering EVM: Optimizing Your Test Setup
Wireless standards for 5G FR1/FR2, WiFi 6/7, NewSpace, and future 6G standards are moving to higher frequencies, wider bandwidths, and/or more complex modulation schemes. Test engineers are upgrading their test equipment for R&D, characterization, and production. This webinar explores how to use your EVM requirements to define your test instrumentation needs while making the most of your budget.
Accurately measuring Error Vector Magnitude (EVM) has become a key specification for both the device under test and the test instrumentation as it encapsulates many RF parameters. With this one measurement, you can ensure noise floor, IQ modulation, phase noise, and amplitude error are within limits.
In this new webinar, we explore how to optimize your test setup by evaluating both the generator and analyzer specifications, as well as how to test to ensure the performance you require. We will discuss what challenges to EVM measurement each standard introduces and how to select and optimize your signal generator and spectrum analyzer to achieve the bathtub curve performance needed for your design.
Speaker - Martin Lim, 5G Component Technology Lead, Rohde & Schwarz USA, Inc.
Martin Lim is a national application engineer with Rohde & Schwarz. He brings with him 22 years of semiconductor, wireless, and RF test experience. Currently focused on mmWave 5GNR physical layer testing. Past projects include 5GNR mmWave test system development; Envelope tracking; Amplifier (FEMiD) test; 802.11AC MIMO; Test Automation Speed & Radiated 5GNR. Prior to joining R&S, he served as RF Characterization Manager at Nokia Mobile Phones. Martin was responsible for cellular Tx/Rx, GPS, and 802.11 test systems development. He received his B.S. in Electrical Engineering from California Polytechnic, Pomona.