One of the most demanding measurements in the design, verification, and production of RF and microwave devices, especially in the aerospace and defense industry, is a spurious emission search with the use of spectrum analyzers. These measurements require very narrow resolution bandwidths to reach the necessary low noise, which increases measurement time. Even using extremely fast spectrum analyzers can take hours or even days to complete. This white paper reviews the basics of spurious measurements and how the parameters used can affect the detection performance. It also presents a new technique with the R&S®FSW-K50, which can be used to make spurious search faster and easier to configure.