USB Microwave CW Power Sensors: MA243X0A Series
The MA243X0A series Microwave CW USB Power Sensors employ a single-path diode architecture to provide fast, accurate average power measurements from 10 MHz up to 50 GHz with 90 dB of dynamic range.
Features and Benefits:
- Broad Frequency Range (10 MHz up to 50 GHz): Ideal for general purpose, aerospace and defense, satellite and wireless communications applications
- MA24330A 10 MHz to 33GHZ
- MA24340A 10 MHz to 40 GHz
- MA24350A 10 MHz to 50 GHz
- Accurate Power Measurements with over 90 dB Dynamic Range
- Best-in-Class Damage Protection (+26 dBm CW, +32 dBm peak < 10 µs): Protects instrumentation investment
- No Zeroing Required (for signals > –50 dBm) and Elimination of 1 mW Reference Calibration: Reduces test time and handling in production while maintaining absolute accuracy
- Advanced Trigger Capabilities: Facilitates time dependent power measurements
- NIST Traceable Calibration: Provides high-accuracy measurements and ensures absolute accuracy
- Calibration Traceable to SI Units via National Metrology Institutes
- Easy to Use with PC or Select Anritsu Handheld Instruments: No benchtop power meter unit needed
- Silicone Protective Covering (removable): Provides additional field durability
- External Trigger Latching: For pulses as narrow as 20 ns
GT-8500A Series USB Power Sensor
The Giga-tronics GT-8550A USB Power Sensors offer easy-to-use high-performance RF and microwave power measurement. High dynamic range and high accuracy make these sensors ideal for testing in wireless communication applications and Defense EW systems.
Microwave USB Power Sensor (MA24218A)
The MA24218A is a power sensor designed with “triple path” architecture that provides True-RMS measurements for CW, multi-tone, and digitally modulated signals from 10 MHz to 18 GHz over 80 dB of dynamic range. The sensor employs high-performance digital processing which enables measurement speeds of >1,600 continuous power readings/s continuous and >11,000 buffered readings/s. It is intended to be used to increase throughput and reduce cost-of-test in any lab, high-volume manufacturing and field environment.