White Paper

Using VNA's As A Tool For Signal Integrity In High Speed Digital Systems

Source: Anritsu Company

Anritsu’s new paper describes the difference in how VNA's and time domain based instruments generate S-parameters and includes:

  • Examination of VNA time domain transformations and how they are effected by VNA bandwidth, frequency step size and low frequency S-Parameter quality
  • S-Parameter quality metrics, including indications of measurement issues
  • Channel characterization and measurement frequencies as it applies to bit rates and encoding
  • VNA de-embedding and network extraction tools as a way to simplify measurements

Download the full paper for more in-depth information on these frequency domain tools and their time domain transformation performance.

access the White Paper!

Get unlimited access to:

Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue. X

Enter your credentials below to log in. Not yet a member of RF Globalnet? Subscribe today.

Subscribe to RF Globalnet X

Please enter your email address and create a password to access the full content, Or log in to your account to continue.

or

Subscribe to RF Globalnet