Anritsu’s new paper describes the difference in how VNA's and time domain based instruments generate S-parameters and includes:
- Examination of VNA time domain transformations and how they are effected by VNA bandwidth, frequency step size and low frequency S-Parameter quality
- S-Parameter quality metrics, including indications of measurement issues
- Channel characterization and measurement frequencies as it applies to bit rates and encoding
- VNA de-embedding and network extraction tools as a way to simplify measurements
Download the full paper for more in-depth information on these frequency domain tools and their time domain transformation performance.