SUSS Introduces IZI Probe Card

Munich, Germany -- SUSS MicroTec AG has announced the newest member of its IZI Probe family, the IZI Probe Card. This new solution integrates the IZI Probe technology into an RF probe card specifically designed for production test.

As RF and microwave devices become more complex and their operating frequencies increase, there is a significant need to extract scattering parameters (s-parameters) on the production floor. These s-parameters describe the performance of the device under test (DUT) and provide critical feedback for the manufacturing process. To extract the s-parameters in production test, manufacturers typically use RF probe cards, which are expensive and difficult, if not impossible, to repair.

SUSS claims its IZI probe card is the first RF probe card that integrates the MEMS-manufactured contact technology of the IZI Probe. The IZI Probe Card can test up to 32 RF channels, and when configured with the Multi IZI Probe, RF and DC signals can be tested using one probe card. Long, independent contact springs ensure the best contact with the DUT, overcoming troublesome variations in pad height. In addition, the PCB carrier board is customizable to accommodate SMD's and other designs.

"The IZI Probe Card is completely repairable", said Steffen Schott, HF Product Manager at SUSS MicroTec Test Systems. "The probes can be replaced quickly and easily when needed. And due to the IZI Probe contact technology, the lifetime of the IZI Probe Card is guaranteed for more than 1 million contact cycles on aluminum pads. These two traits effectively increase the return on investment for the IZI Probe Card."

SOURCE: SUSS MicroTec