Brochure | August 6, 2004

Brochure: SUSS High-Frequency Probing

Source: SUSS MicroTec
Testing and characterizing all types of high-frequency components requires a specially designed measurement set-up, consisting of a vector network analyzer (VNA), a wafer probe system, HF probes, special HF cables, calibration substrates, and, idealy, calibration software.

SUSS offers a complete line of probing solutions for testing and characterizing all HF components right along the frequency range.

access the Brochure!

Get unlimited access to:
Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue. X

Enter your credentials below to log in. Not yet a member of RF Globalnet? Subscribe today.

Subscribe to RF Globalnet X

Please enter your email address and create a password to access the full content, Or log in to your account to continue.

or

Subscribe to RF Globalnet

Please tell us more about you so that we can customize our newsletters to your specific interests: