Application Note

Application Note: Advanced RFID Measurements: Basic Theory To Protocol Conformance Test

Source: National Instruments Corporation
This article explains both the basic functionality of RFID systems as well as the measurements that are commonly made. The goal is to provide readers with a solid understanding of some of the key technical design and implementation challenges faced by RFID design and test engineers. In addition, insight into how customers have used measurement systems based on PC-based modular instruments in their own research and development of RFID products is provided.
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