Guest Column: Meeting The Test Challenges Of 4G LTE

By Mark Elo, Keithley Instruments, Inc.

As RF designers work rapidly to create products that support the new long term evolution (LTE) cellular wireless standard, understanding the new test requirements for LTE assumes ever greater importance as this technology becomes more widespread. For the wireless industry, these changes are nearly as significant as the move from analog to digital, requiring new measurements and new test equipment. This article looks at what LTE is and the main challenges to testing for engineers.