RF Measurement Services
•RF And Microwave Product Overview
RF Measurement Services
Modelithics has an extensive array of test equipment and expertise to guarantee complete and accurate measurement services and testing of a wide variety of RF/microwave parameters. Despite our excellent equipment inventory, our most valuable assets are the discipline and professionalism we demonstrate in precise measurement and careful documentation.
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Wafer-Probe and other Configurations
Modelithics emphasizes wafer probe measurements of semiconductor wafers and chips, as well as surface-mount components assembled on hybrid boards. Other configurations include microstrip and coplanar test fixtures, and RF measurements to coaxial or waveguide reference planes. S-Parameter Measurements Multiple vector network analyzer (VNA) test platforms cover the following frequency bands:
| 30 kHz to 6 GHz | HP 8753 |
| 0.045 to 50 GHz | HP 8510C |
| 0.040 to 40 GHz | Anritsu Lightning |
| 0.040 to 65 GHz | Anritsu Lightning |
| 65-110 GHz | Anritsu Wiltron 360/Oleson MM-wave Extension Modules |
True 4-port S-parameter measurements through 26 GHz are available to support mixed-mode circuit design applications.
Noise Measurements
Noise measurements are performed in a screen room to minimize local electromagnetic interface.
| Flicker (1/f) Noise | 10Hz to 100kHz (extension to 1 MHz available) | Custom test setup |
| 50 ohm Noise Figure | 10 MHz to 26 GHz | HP8970/HP8971 |
| Noise Parameters (NFmin, Rn, Gopt) | 2 to 26 GHz | Maury ATN NP5 |
| Noise Parameters (NFmin, Rn, Gopt) | 0.3 to 6 GHz | Maury ATN NP5 |
| Other Bands | Contact Modelithics |
*Advanced development capability used less frequently than the below 26 GHz noise parameter systems. Basic measurements include the standard noise parameters Fmin, Gamma-opt, Rn
Load- and Source-Pull Measurements
Load- and source-pull measurements can be performed to generate impedance contours for optimizing the tradeoff between various amplifier performance parameters, such as output power and 1 dB compression, power-added-efficiency (PAE), transducer gain, and third-order-intermodulation distortion (IM3 or TOI).
Fundamental tuning 0.2 to 50 GHz Maury ATS
Harmonic tuning 2.45 GHz, 5.25 GHz fundamental (2nd and 3rd harmonic can be tuned)
Fundamental tuning 75 to 110 GHz Maury ATS
DC Pusled IV
For transistor and diode characterization modeling, DC and pulsed measurements are made using the following equipment:
DC IV characterization - HP4142 DC Parameter Analyzer, Keithley 4200 Semiconductor Parameter Analyzer
Pulsed IV measurements - Accent DIVA
C-V measurements - Keithley 590
Other Instrumentation and Software
Many other measurements and software tools are available to help support model development requirements, including:
Q-factor measurements of discrete passives - Boonton Resonant Coaxial Line
Impedance measurements to 3 GHz - Agilent 4287A
CAE and electromagnetic simulation software from Agilent Technologies (ADS, ICCAP, Momentum), Ansoft (HFSS, Designer), Applied Wave Research (Microwave Office), Agilent Eagleware (GENESYS), Cadence (Spectre RF and PSPICE) Gateway Modeling (Special), NIST (Multical), Maury Microwave, Sonnet Software, and other companies.
Click Here To Download:•RF And Microwave Product Overview