Presentation | May 7, 2010

Presentation: Precise, Repeatable RF Measurements Using CPW Probes

Source: J Micro Technology

Electronic components and assemblies are shrinking in size, while simultaneously increasing in frequency range and performance. As a result, electronic parts are often too small to see, touch, or test, and demand for better test signal environments and more precise test methods is on the rise. This presentation explores these everyday test problems in depth, and explains how coplanar waveguide (CPW) probes can be used to address them.

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