The ML2437A Power Meter combines the advantages of thermal meter accuracy, diode meter speed, and peak power meter display graphics. The result is a single instrument that samples at more than 35K per second and achieves 90 dB dynamic range with a single sensor. This meter includes graphics display capability as a standard feature. The ruggedized housing and optional high-capacity NiMH battery bring laboratory quality accuracy to field service applications. ML2437A has one input.
Compatible power sensors include the MA244xD Series, the MA247xD Series, and the MA248xD Series.
For portable USB power measurements see MA24106A.
Applications needing a wider bandwidth power should also consider the ML2487A/88A or ML2495A/96A power meters.
Speed and dynamic range
The 90 dB range MA247xD Series Power Sensors’ high sensitivity reaches stable power readings to -70 dBm. 35 kHz sample rates profile cellular, PCS and other pulsed signals to 0.1 msec resolution. Modern connector technology achieves industry leading return loss for improved accuracy through 50 GHz. The 87 dB range MA244xD Series High Accuracy Sensors further improve return loss performance by adding a matching circuit to the MA247xD Series’ front end.
Fast thermal sensors
Anritsu’s latest semiconductor processing technology produces thermal power sensors with speed increased by an order of magnitude. Improvements in connector technology reduce measurement mismatch uncertainty through 50 GHz to levels previously attained only to 20 GHz. The fabrication technique as well as the ML2430A Series' sampling and DSP technology optimize measuring speed to 4 ms rise and fall times.
Industry leading speed is achieved under a variety of operating conditions including averaging settings, sensor control settings, triggering conditions, operating mode, sensor type, and GPIB interface manufacturer. The ML2430A series offers the ability to measure and transfer a high speed burst of 200 data points using profile operating mode with sampling rates of 35k per second.
With 99.9% emulation of older meters, the ML2430A series improves ATE system productivity. Typical test system speed improvement is 2 to 10 times faster system speed depending upon the number of measurements taken during the test, the minimal use of wait statements within the code, and the meter model emulated.
What use is high speed without triggering and sample controls? Data acquisition event arming and triggering functions traditionally found on expensive peak power meters are standard in the ML2430A series. Triggering delay and the sample integration time per reading can be directly controlled by the operator. Trigger sources include, continuous, internal, external TTL, and manual. Thus, data acquisition can be optimally controlled for synchronization with other test equipment.
Burst profile graphics display
The ML2430A features random repetitive sampling for high resolution of fast signals. A time domain graphic display profiles pulsed signals over a power range of –40 dBm to 20 dBm. 35 kHz sampling speed produces clear power profiles of cellular and PCS signals including TDMA, PHS, GSM, and DCS-1800. Pulse-top power is easily and repeatably measured using between cursor averaging. Measure pulse-top power over >80 dB dynamic range in readout mode at GPIB speeds >200 readings per second.
Power vs. time graphics display
One of the most common power meter ATE program types is a plot of RF power versus some stimulus. The power versus time mode is a strip chart style display for monitoring gain and output power variations over time/temperature, supply voltage or a component tolerance. In service applications, power versus time mode speeds trouble shooting of unusual conditions such as intermittent switches or abnormal power control in a mobile telephone. The power versus time mode provides a clear strip chart display of RF power variation.
Parallel printer connector
Many deskjet series printers can be connected directly to the ML2430A Series for fast documentation of performance on the bench or in the field. Meter calibration, triggering and averaging settings are listed with the display printout. Thus, evidence of DUT (device under test) anomalies can be duplicated quickly, allowing engineers to fix problems with minimal time investment.