Measuring Ultra Low Noise Metrological Reference

Signal sources with very low phase noise have significantly improved in their performance over the past few years. However, it has also become increasingly difficult to measure such low phase noises with standard and even dedicated phase noise measurement systems. This white paper presents a measurement setup that permits the capture of phase noise below the specified noise floor of the instrument by externally down converting a microwave signal to a low IF frequency. Download the full paper for more in-depth information.