Maury Microwave And Agilent Enable Approach To Measure And Simulate Nonlinear Component Behavior At All Load Impedances

During European Microwave Week, September 28 - October 2 in Rome, Italy, Maury Microwave will conduct live demonstrations at Agilent's booth (stand #539) of two unique breakthrough applications for the NVNA and PNA-X; 1) Maury Load Pull with NVNA X-parameter data extraction providing a simple, effective and instantaneous path from measurement to circuit design, with "drag-and-drop" compatibility to ADS, and 2) PNA-X based noise parameter measurements (patent pending) that yield 100x speed improvement and enhanced accuracy versus the traditional method. These Maury/Agilent applications are perfect examples of Channel Partners working together for your benefit. Maury will also exhibit a showcase of other products with its Italian distributor, CPE Italia SpA (stand #710).

The seamless integration of the Maury automated tuners and software with Agilent's PNA-X makes setups very simple and easy to use. The newly released Maury ATS version 5.1 software is installed into the PNA-X and the tuners are simply connected to USB ports on the front panel of the PNA-X. Two new solutions both demonstrate breakthough capabilities. Maury Load Pull + PNA-X Provides Instant Large Signal Models for PA Design.

Combining Maury Load Pull software with X-Parameters is very significant, because the measured data reads directly into Agilent's ADS (Advanced Design System) simulator, and acts like a large signal model without the modeling effort. This provides a simple and effective way to go immediately from measurement to circuit design. The NVNA (nonlinear vector network analyzer) option in the PNA-X also allows fast power measurements and analysis of time domain waveforms vs. impedance.

Download the related Maury Application Notes: 5A-041 - Load Pull + NVNA = Enhanced X-Parameters for PA Designs with High Mismatch and Technology-Independent Large-Signal Device Models; 5C-083 - Setting Up Load Pull with X-Parameters Using the Agilent NVNA

100x Speed Improvement in Noise Parameter Measurement

This new noise parameter measurement method uses a simplified setup, operates radically faster than previous methods, and results in enhanced accuracy with smoother data and less scatter. By itself, the PNA-X provides error corrected Noise Figure at 50 Ohms. With one or two Maury tuners, the DUT S-Parameters and full Noise Parameters are measured, with results in just 8 minutes (including Tuner Cal, Noise Receiver Cal, and DUT measurements for 73 frequencies). The calibration and measurement is very fast, simple, and accurate.

Download the related Maury Application Notes: 5A-042 - A New Noise Parameter Measurement Method Results in More than 100x Speed Improvement and Enhanced Measurement Accuracy; 5C-084 - Setting Up Ultra-Fast Noise Parameters Using the Agilent PNA-X

SOURCE: Maury Microwave