ETS-Lindgren Educates Engineers At EMC 2010
Cedar Park, TX – ETS-Lindgren engineers will present in several technical sessions scheduled during the 2010 IEEE International Symposium on Electromagnetic Compatibility (EMC 2010) in Fort Lauderdale, Florida over July 25-30. The annual symposium is the premier gathering of EMC engineers from industry, academia and government organizations and attracts over 2,000 attendees from around the world.
Since antennas and probes are an important part of the majority of EMC tests, ETS-Lindgren's Senior Principal Design Engineer Zhong Chen returns once again as chair of the popular "Practical Radiated Measurements using Antennas and Field Probes – Fundamental and Advanced Topics." This full day tutorial provides an introduction to antenna and probe theory addressing applications relevant to EMC. In addition to Mr. Chen, invited speakers include Michael Windler of Underwriters Laboratories (UL), Bob DeLisi of UL, Dennis Camell of the National Institute of Standards and Technology (NIST), Werner Schaefer of Cisco Systems and Vince Rodriguez of ETS-Lindgren. Basic topics will be addressed in the morning, with advanced topics presented in the afternoon. Presentations will review related standards activity, uncertainty evaluations of antenna and probe calibrations, time domain methods for antenna calibration and usage, system integration, and instrumentation considerations for antenna and probe applications. The implications of the antenna characteristics on EMC testing will also be discussed including the nature and use of antenna factors, gain, radiation resistance, VSWR, etc.
Dr. Vince Rodriguez, ETS-Lindgren's Senior Principal Antenna Design Engineer, will chair the tutorial "Application of Time Domain Measurements for Test Site Validation and Antenna Calibration." In addition to Dr. Rodriguez, invited speakers include Michael Windler of UL, Dr. Robert T. Johnk of the Institute for Telecommunication Sciences (NTIA/ITS), Jeff Poole of Agilent Technologies, and Tim O'Shea of Northwest EMC. The purpose of this tutorial is to educate engineers on the recent activity in ANSI ASC C63® and IEC/CISPR developing new procedures for validating EMC radiated emission test sites above 1 GHz. The VSWR and time domain measurement methods as well as a discussion of antenna theory and the importance of pattern information will be addressed. An introduction to the validation techniques that are likely to be required in the near future for test site validation and antenna calibration will be reviewed. EUT test setup, selection of a test facility, test instrumentation, and other challenges in product compliance testing above 1 GHz will also be addressed.
In the popular "Demonstrations and Experiments" sessions held in the exhibit area, Joe Tannehill, EMC Software Engineer, will present "Improving EMC Test Productivity with Automated EMC Test Software." With increasingly shorter product cycle "time to market," the need for increasingly efficient EMC testing becomes more urgent. There are many options available today for automated EMC test software that can greatly improve EMC test productivity. This demonstration will provide practical tips on how to evaluate the software available, how to utilize your existing test instrumentation, and how to generate reports.
The ANSI ASC C63® workshops will be held at the Fort Lauderdale Convention Center on July 23-24. Zhong Chen, Member of ANSI ASC C63®, is an invited speaker to address the standard C63.5 on antenna calibration. As an active member of this working group, Mr. Chen will share his expertise on antenna calibration. He will review the relevant background, practical applications, and changes in the antenna calibration methods as well as provide guidance on what to look for in a quality calibration.
It will certainly be a busy week for ETS-Lindgren engineers as they share their expertise in designing new solutions for the test and measurement of wireless, microwave, military and commercial products.
For more information on the 2010 IEEE International Symposium on EMC, including the technical program and schedule, visit www.emc2010.org. For more information on the ANSI ASC C63® workshops, visit www.C63.org.
SOURCE: ETS-Lindgren