Datasheet | December 3, 2018

Epsilometer Solution For Measuring Dielectric Properties Datasheet

Source: Copper Mountain Technologies

The Epsilometer solution for measuring the dielectric properties of substrate materials from 3 MHz up to 6 GHz and can accommodate sheet specimens from 0.3 to 3 mm thick. A database in the software for the device is used to invert properties and is populated up to a permittivity of 25. Material specimens are inserted into the device and scanned to obtain their microwave response versus frequency. Download the datasheet for more information.

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