Empirically Based Multichannel Phase Noise Model Validated In A 16-Channel Demonstrator
Source: Analog Devices
By Peter Delos and Michael Jones, ADI
This article details a systematic approach for predicting phase noise in large multichannel systems and compares it with measurements on a 16-channel S-band demonstrator. This analytic approach is based on a small set of measurements that can be used to estimate correlated vs. uncorrelated noise contributions. Based on only a few measurements, phase noise under a wide range of conditions can be predicted.
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