DARPA Developing New Radiation Testing Capabilities For Space-Bound Electronics
By John Oncea, Editor
DARPA’s ASSERT program is aimed at improving radiation testing for space-bound electronics using their advanced compact laser-plasma accelerator technology.
The Defense Advanced Research Projects Agency (DARPA) was created in response to the 1957 launch of Sputnik and to this day stands as the U.S.’s commitment to never again face a strategic technical surprise. Working with innovators inside and outside government, DARPA pushes transformational breakthroughs – innovations that not only solve current challenges but also establish the U.S. as the leading driver of strategic technological invention.
One new technology DARPA is developing in collaboration with NASA’s Jet Propulsion Laboratory, Aerospace Corporation, and other industry partners will contribute to enhancing the resilience of microelectronics used in defense satellites, spacecraft, and communication systems.
This new technology will address the growing demand for radiation testing, increasing available beam time and improving testing accuracy for space electronics at a fraction of the size and cost of traditional accelerators.
Changing The Way Radiation-Hardened Microelectronics Are Designed
The harsh conditions of space present a critical challenge for electronic systems used in satellites, spacecraft, and other space-based technologies. Single Event Effects (SEE) caused by high-energy cosmic radiation can disrupt or damage these systems, leading to catastrophic mission failures.
DARPA’s Advanced Sources for Single Event Effect Radiation Testing (ASSERT) initiative seeks to enhance the resilience of electronics deployed in space environments where exposure to cosmic radiation poses significant risks to performance and longevity. DARPA’s goal is to develop additional reliable sources for SEE radiation testing that can emulate the cosmic radiation encountered in space.
In addition, ASSERT sources will empower the radiation effects community to develop new standards and practices for emergent technologies such as 3D heterogeneously integrated (3DHI) devices and provide data to validate new theories and computational models.
Bridging The Gap In Beam-Time Demand
SEE occurs when high-energy particles, such as protons and heavy ions found in space, disrupt electronic components. These disruptions can generate currents or voltage spikes, potentially causing temporary malfunctions or even permanent damage. For critical defense and commercial satellites, SEE poses a significant risk, as they can disrupt essential functions like communication, navigation, and data collection—systems that must remain dependable in extreme environments.
The U.S. currently has only four facilities capable of conducting premium Single Event Effects (SEE) radiation testing, collectively offering approximately 5,000 hours of beam time per year – far short of the estimated 30,000 hours required by academia and industry, reports Electronics Specifier.
Traditionally, radiation-hardened electronics undergo SEE testing using high-energy beams from large ion accelerators, simulating space radiation effects. However, as electronic systems advance, there is a growing need for more sophisticated testing platforms. DARPA’s ASSERT initiative aims to bridge this gap by developing next generation testing solutions.
How Compact Accelerator Works
Particle accelerators have immense potential across various fields, including semiconductor applications, medical imaging and therapy, and research in materials, energy, and medicine. However, traditional high-energy accelerators require vast amounts of space—some stretching miles—making them costly and limiting their availability to a few national laboratories and universities.
TAU Systems, a partner in DARPA’s ASSERT initiative and a leader in particle accelerator technology, has developed and rigorously tested a compact Laser Wakefield Accelerator (LWFA) with broad applications. Beyond evaluating the radiation resilience of space-bound electronics, this technology also will enable 3D imaging of semiconductor chip structures, facilitate the development of novel cancer treatments, and advance medical imaging techniques.
“As chips become more powerful and transistors become smaller, they also become more susceptible to cosmic radiation,” said Bjorn Manuel Hegelich, CEO and Founder of TAU Systems. “To be able to use advanced computing and automation methods like machine learning (ML) and artificial intelligence (AI) in space, rigorous testing using advanced particle accelerators is essential to enabling new technology, protecting critical assets, and ensuring mission success.”
Additionally, this compact accelerator could power an X-ray-free electron laser, serving as a next-generation light source beyond EUV lithography for even more advanced chip manufacturing. It could also be used to capture real-time atomic and molecular-scale processes, such as drug interactions with cells, thermal runaway in batteries, chemical reactions in solar panels, and structural changes in viral proteins during infection.
The concept of LWFA was first introduced in 1979. In this method, an ultra-intense laser strikes a gas target – such as helium – ionizing it into plasma and generating plasma waves. These waves accelerate electrons from the gas, producing a high-energy electron beam. The process is akin to a boat skimming across the water, creating a wake that surfers ride – in this case, electrons riding the plasma wave.
Over the past few decades, researchers have continuously improved LWFA technology, achieving greater power levels. Hegelich’s team currently holds the record, demonstrating an acceleration gradient exceeding 100 billion volts per meter, 1,000 times more powerful than even the most advanced conventional accelerators.