Breakdown And Leakage Current Measurements On High Voltage Semiconductor Device

Testing new silicon carbide and gallium nitride high voltage, high-power semiconductor devices involves the consideration of test system safety, wide voltage ranges, and accurate current measurements. Coupling a Keithley SourceMeter SMU instrument like the 2470, KickStart software, and their associated accessories meets all these needs and further facilitates research of high voltage materials and semiconductor devices. Download the full application note for more in-depth information on how to successfully address the challenges inherent with these new high voltage materials and semiconductor device testing.