AWR, Auriga To Provide Measurement And Model Test System
El Segundo, CA and Lowell, MA -- Cadence Design Systems, Inc. (AWR) and Auriga Measurement Systems, a supplier of active/passive device modeling, characterization systems, and manufacturing test systems, announced an original equipment manufacturer (OEM) agreement that provides designers and modeling engineers with a new modeling and extraction solution. Under the terms of the agreement, Auriga will embed AWR's Microwave Office design software into the company's soon-to-be-released measurement and model extraction test system.
Accurate simulation models are critical for the successful design of both silicon and gallium arsenide (GaAs) integrated circuit (IC) components on printed circuit boards (PCBs) or embedded in modules. Traditional measurement systems and the associated software for model extraction can be difficult to use because of the closed nature of these systems. It is essential to have a system that provides broader choices in the selection of models and test equipment.
"One thing we hear over and over again from designers in all media is the need for high-quality models," said James Spoto, AWR president and CEO. "Through the AWR unified data model architecture, Microwave Office design suite delivers unprecedented openness, flexibility, and ease-of-use. As the core of Auriga's test system software, Microwave Office technology will certainly enhance the product's ability to meet demand for more accurate models and a wider variety of test equipment."
"We want to make a real difference in the way microwave circuits and modules are designed and developed," said Dr. Yusuke Tajima, director of modeling and design at Auriga. "Demands on modeling are becoming tougher as system requirements increase in sophistication every year. Designers are dealing with more complex signal environments and new types of devices all the time. The device modeling capability in the industry is falling behind these demands, and Auriga is going to provide a solution. Customers will benefit from this solution in terms of both faster model development and more accurate model implementation."
Source: AWR and Auriga Measurement Systems