Datasheet | January 28, 2010

Product Overview: PXI Modular RF Test System

Source: Aeroflex
The PXI 3000 Series achieves up to five times higher throughput than conventional instrumentation leading the market in terms of test speed. Low test times are the result of very fast responding hardware and the performance gains derived from the use of multi-core processors. Multiple simultaneous measurements and multi-device testing becomes a reality when realizing the benefits of multi-core processing through the inherent open software architecture.
access the Datasheet!

Get unlimited access to:
Trend and Thought Leadership Articles
Case Studies & White Papers
Extensive Product Database
Members-Only Premium Content
Welcome Back! Please Log In to Continue. X

Enter your credentials below to log in. Not yet a member of RF Globalnet? Subscribe today.

Subscribe to RF Globalnet X

Please enter your email address and create a password to access the full content, Or log in to your account to continue.

or

Subscribe to RF Globalnet

Please tell us more about you so that we can customize our newsletters to your specific interests: