TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• How To Configure Generic Devices In R&S Elektra

  R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• 5G New Radio Over-The-Air Base Station Receiver Tests

  This application note describes all mandatory RF receiver tests, according to the Release 16 (V16.3.0). It also offers a brief introduction about the different R&S OA antenna test solutions and how they are applicable for base station conformance testing.