TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• How To Configure Generic Devices In R&S Elektra

  R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

• Testing A 24-28GHz Power Amplifier Using The 5G New Radio Test Standard

  In this white paper, we will introduce some of the main challenges in test and measurement of a device at mmWave frequencies, with a 26 GHz pioneer band defined for the UK between 24.25 - 27.5 GHz.

• Accurate Test Fixture Characterization And De-Embedding

  This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.