TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• De-Embedding Test Fixtures For High-Speed Digital Applications

  Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• Crowdsourcing Versus Mobile Network Testing

  The need for an objective evaluation of mobile network quality and performance drives two fundamentally different approaches, crowdsourcing, and mobile network testing.

• RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

  How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

• Field Probe Correction Factors

  To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.