TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Top 10 Considerations For Automotive EMC Chamber Design And Testing

    This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

  • Introduction To RNVNA, A Multiport Network Analysis Solution

    In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.

  • Load Transient Response – Enhancing Loop Stability Testing

    Ensuring stability in power supply design requires validating switching converter stability through frequency loop and load transient responses, aided by modern oscilloscopes for visualizing PWM signals and identifying converter effects.

  • Electronic Packaging: Using EMI Material-Based Solutions

    It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

  • Certium VCS Test System For Aircraft Manufacturers

    New aircraft need to have their radiocommunication systems tested with compact voice communication systems like CERTIUM VCS. This is cost-effective, space-saving, and scalable thanks to its IP-based infrastructure.

TEST & MEASUREMENT SOLUTIONS

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

The dB-9001 from dB Control is a custom-mounted Instantaneous Frequency Measurement (IFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.