TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Design Of A Complete RF Downconverter Module For Test Equipment
The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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How To Perform A Radiated Emissions Measurement
Explore the intricacies of setting up radiated emissions testing with this guide, covering everything from antenna placement and polarization to accurate frequency selection and signal measurement.
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What Is Pulse Shaping?
In this industry briefing,George Bollendorf explains a new approach to fix fidelity issues caused by the transmitting amplifier that matches input pulse signal shape, minimizes droop, overshoot, ringing, and rise and fall times.
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DPX® Acquisition Technology For Spectrum Analyzers Fundamentals
Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions