TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Understanding Component EMC Testing for ICs

    If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

  • Accurate Test Fixture Characterization And De-Embedding

    This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

  • Wi-Fi Performance In A House With Two Routers

    Wireless InSite’s Communication System Analyzer provides capabilities for assessing the performance of LTE, WiMAX, 802.11n, and 802.11ac systems. This example investigates WiFi throughput coverage in a house provided by 802.11ac routers operating at 5 GHz using an 80 MHz bandwidth.

  • Circuit Models For Plastic Packaged Microwave Diodes

    This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.

  • How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

    This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

TEST & MEASUREMENT SOLUTIONS

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

dB Control’s family of traveling wave tube amplifiers (TWTAs) features a combined frequency range of 2 to 18 GHz up to 15kW output power. dB Control utilizes our proprietary transformer fabrication, encapsulation and high-voltage potting techniques developed for demanding military applications which results in superior reliability, low cost and ease of maintenance.  Products in this series are ideal for several applications, including: test and measurement, electronic warfare (EW) simulation, RFI/EMI/EMC Testing, electronic countermeasures (ECM), and antenna pattern and radar-cross section measurements.

Holzworth’s multi-channel RF synthesizer architecture is a complete success story. These compact, 1U high, 19in rack mountable chassis can be configured with up to 8 independently tunable channels. All integrated channels are 100% phase coherent. Holzworth has designed the multi-channel platform for integration of our HSM Series Single Channel Synthesizers to maximize channel-to-channel stability via a conductively cooled, fan-less enclosure.

The SI893x’s 0 to 2.25 V specified input range is ideal for isolated voltage sensing. The Si8935/36/37 provides delta-sgma modulated output with flexible options for external or internally generated clock.

The Si894x is a galvanically isolated delta-sigma modulator which outputs a digital signal proportional to the voltage level at the input. 

The dB-9004 is a custom-mounted Integrated Antenna Digital Control Unit (IADCU). It operates in the C, X and Ku-band frequency range and provides highly accurate RF output (FM, AM and pulse-shape modulated)

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.