TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz

  Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.

• Verifying The Clock Source

  In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

• Understanding Component EMC Testing for ICs

  If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

• Design Of A Complete RF Downconverter Module For Test Equipment

   The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.

• Combining On-Wafer VNA And Spectrum Analyzer Measurements

  This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.