TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.

• VSWR Conversion To Reflected Power

  VSWR measures how efficiently RF power is transmitted through a load, with high VSWR indicating poor efficiency. Explore VSWR's relation to return loss, reflection coefficient, and mismatch loss.

• Harmonic Measurement For IEC 61000-4-3 And Other Radiated Immunity Standards

  Amplifiers exhibiting significant harmonic distortion in immunity test systems can exhibit broadband characteristics that result in measurement uncertainty and unacceptable errors. This app note addresses acceptable harmonic measurement standards and other radiated immunity standards.

• Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces

  In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.