TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

• Battery Cycle Tool For The R&S NGU401/NGU201/NGM200/NGL200

  The battery cycle tool has several charts that display collected data and can be used to characterize battery samples and create battery models.

• Harmonic Measurement For IEC 61000-4-3 And Other Radiated Immunity Standards

  Amplifiers exhibiting significant harmonic distortion in immunity test systems can exhibit broadband characteristics that result in measurement uncertainty and unacceptable errors. This app note addresses acceptable harmonic measurement standards and other radiated immunity standards.

• Understanding Component EMC Testing for ICs

  If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.