TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• De-Embedding Test Fixtures For High-Speed Digital Applications

  Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

• Noise Figure: What Is It And Why Does It Matter?

  Noise figure is a key parameter that quantifies receiver performance by measuring how low a power a signal receiver can detect. This white paper covers the basic principles of noise figure, how to make sense of its specifications, how it is measured, and why this parameter is important in high-performance applications.

• Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces

  In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.

• RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

  How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.