TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • De-Embedding Test Fixtures For High-Speed Digital Applications

    Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

  • Speeding Up Reflection Measurements On Antenna Systems

    Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

  • Certium VCS Test System For Aircraft Manufacturers

    New aircraft need to have their radiocommunication systems tested with compact voice communication systems like CERTIUM VCS. This is cost-effective, space-saving, and scalable thanks to its IP-based infrastructure.

  • RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

    How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

  • Noise Figure: What Is It And Why Does It Matter?

    Noise figure is a key parameter that quantifies receiver performance by measuring how low a power a signal receiver can detect. This white paper covers the basic principles of noise figure, how to make sense of its specifications, how it is measured, and why this parameter is important in high-performance applications.

TEST & MEASUREMENT SOLUTIONS

Producing a system that excels in performance and reliability is easy when you have System Design and Applications Engineers with years of experience, Customer Service with global reach, and products that are known for performance and quality. AR has this very organization and product offerings. AR is here for you at each step to ensure that the system design, integration, and support of your EMC or RF system complies with your goals.

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

The SI893x’s 0 to 2.25 V specified input range is ideal for isolated voltage sensing. The Si8935/36/37 provides delta-sgma modulated output with flexible options for external or internally generated clock.

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

Radar simulation systems (i.e., RF sources and/or receivers) must perform to an exacting minimum standard if they are to accurately prove the field worthiness of EW systems.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.