TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Reduce Risk With A Better Measurement Process
Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.
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Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz
Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.
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Introduction To RNVNA, A Multiport Network Analysis Solution
In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.
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S-Parameters For High-frequency Circuit Simulations
Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.
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Quantum-Enabled Radar Research: Finding The Right Solution
Examine how high-precision measurement of oscillators helped UK Quantum Technology Hub research to develop high-precision radar for detecting small objects such as drones and birds.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions