RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

DPX® Acquisition Technology For Spectrum Analyzers Fundamentals
Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.
Testing For Coexistence In Crowded And Contested RF Environments
In this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.
AC-DC Converter Testing Fundamentals
AC-DC conversion stage in front of any electronic equipment is needed. For this purpose, different solutions exist to convert the higher AC voltage to a lower and safe DC voltage.
EMI Debugging Using Fast FFT With MXO Oscilloscopes
Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.
De-Embedding Test Fixtures For High-Speed Digital Applications
Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

More Test & Measurement Application Notes and White Papers

TEST & MEASUREMENT SOLUTIONS

Extended Frequency Spectrum Analyzer: EVO-RSA-6070A

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

Si8935/36/37 Isolated Delta-Sigma Modulator For Voltage Measurement

The SI893x’s 0 to 2.25 V specified input range is ideal for isolated voltage sensing. The Si8935/36/37 provides delta-sgma modulated output with flexible options for external or internally generated clock.

20 – 5,000 MHz 1P8T RF Switch For Economical Automated RF Testing: 50S-2133 SMA

The 50S-2133 SMA from JFW is a solid-state, self-terminating 1P8T RF switch designed for economical automated RF testing applications in the 20 – 5,000 MHz frequency range.

AR Predefined Systems

Producing a system that excels in performance and reliability is easy when you have System Design and Applications Engineers with years of experience, Customer Service with global reach, and products that are known for performance and quality. AR has this very organization and product offerings. AR is here for you at each step to ensure that the system design, integration, and support of your EMC or RF system complies with your goals.

8-Channel A/D & D/A QuartzXM eXpress Module: Model 6003

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

Surface Mount Mixer And Detector Schottky Diodes: SMS7630 Series

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

GORE® VNA Microwave/RF Test Assemblies

The series of GORE^® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

Microwave And RF Test Assemblies: GORE® PHASEFLEX® Series

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

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