RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

RF Test Setup For Measuring Power & Harmonics
Power measurement is accomplished by using a high-power calibrated coupler or attenuator, which gets attached to the Amplifier RF output connector. Harmonics are recorded similarly by increasing the input drive from the signal source.
Accurate Test Fixture Characterization And De-Embedding
This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.
Telecommunications Testing Using AR Amplifiers
This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.
VCO Measurements With FSPN Phase Noise Analyzer
This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.
Transmit And Receive Testing Of Digital Waveforms Using R&S®CMA180
The compact R&S®CMA180 Radio Test Set allows straightforward tests on devices that use analog or digital modulation and demodulation formats. This application note focuses on the use of the digital radio capabilities for measurements on radio transceiving devices in terms of their functionality and parameter characterization. Also shown is how to use the instrument with the various software tools available from Rohde & Schwarz for creating and evaluating digitally modulated signals.

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TEST & MEASUREMENT SOLUTIONS

Holzworth Phase Noise Measurement Analyzers

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

TWT Amplifier: dB-3908

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

Extended Frequency Spectrum Analyzer: EVO-RSA-6070A

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

1800 W, 65 V, 1.0 – 1.1 GHz Highest Power GaN Transistor On The Market: QPD1025L

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

XFdtd Superposition For Advanced Phased Array Design

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

8 – 12 GHz, 10 W GaN SPDT Switch: QPC2040

Qorvo introduces the QPC2040 single-pole, double-throw (SPDT) switch operating within the 8 – 12 GHz frequency range for commercial and military radar, communications, electronic warfare, test instrumentation, and other general purpose applications. The switch typically supports 10 W input power handling at control voltages of 0/−2 V for both CW and pulsed RF operations.

Capacitance Meter

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

Electrostatic Discharge (ESD) Testing Simulation

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

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