RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

Power Supply Control Loop Response Measurements (Bode Plot)
The R&S^®RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers.
Battery Cycle Tool For The R&S NGU401/NGU201/NGM200/NGL200
The battery cycle tool has several charts that display collected data and can be used to characterize battery samples and create battery models.
Electronic Packaging: Using EMI Material-Based Solutions
It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.
Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle
Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.
Perform High Impedance Measurements With Spectrum Analyzers
Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

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TEST & MEASUREMENT SOLUTIONS

XFdtd Superposition For Advanced Phased Array Design

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

1800 W, 65 V, 1.0 – 1.1 GHz Highest Power GaN Transistor On The Market: QPD1025L

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

Electrostatic Discharge (ESD) Testing Simulation

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

Integrated Stabilized RF Source: dB-9003, dB-9005

The dB-9003 and dB-9005 from dB Control are custom-mounted Integrated Stabilized RF Sources (ISRFS) designed to operate in the I and Ka-band frequency range. Both products feature high accuracy and a wide temperature operating range. They can be controlled and set up with a digital port. The units are packaged in a custom configuration with conduction cooling.

Dual Instantaneous Frequency Measurement Unit: dB-9002

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

1 – 6 GHz, 20 Watt Wideband Amplifier: MS010620

Microwave Systems offers the MS010620 multi-octave, high-power GaN amplifier designed to operate from 1 to 6 GHz. It is ideally suited for use in communications systems, radar systems, test instrumentation, broadband RF telemetry, point to point radio, and fiber optics applications.

MXO 5 Series Oscilloscope

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

Microwave VME/VXS Tuner: SRX-00140-VME

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

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