TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Testing For Coexistence In Crowded And Contested RF Environments

    In this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.

  • Field Probe Correction Factors

    To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.

  • Top 5 Strategies For 5G Component Characterization And Test

    Component manufacturers need to deploy effective strategies for characterization and test regardless of the component types. This white paper presents five strategies for 5G component characterization and testing.

  • S-Parameters For High-frequency Circuit Simulations

    Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.

  • EMC32 To R&S ELEKTRA Migration Using The ELEKTRA Migration Tool

    Discover how to use the R&S ELEKTRA Migration Tool for converting the backup data into the XML format that can be interpreted by the R&S ELEKTRA software.

TEST & MEASUREMENT SOLUTIONS

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

The SI893x’s 0 to 2.25 V specified input range is ideal for isolated voltage sensing. The Si8935/36/37 provides delta-sgma modulated output with flexible options for external or internally generated clock.

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

Qorvo offers the CMD240C4 wideband GaAs MMIC distributed amplifier housed in a leadless 4x4 mm surface mount package. The amplifier operates from DC to 22 GHz and is ideal for radar, space, satcom, test and measurement, and electronic warfare applications.