TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Accurate Test Fixture Characterization And De-Embedding

  This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.

• Top 10 Considerations For Automotive EMC Chamber Design And Testing

  This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

• Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

  The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S^® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

• RF Test Setup For Measuring Power & Harmonics

  Power measurement is accomplished by using a high-power calibrated coupler or attenuator, which gets attached to the Amplifier RF output connector. Harmonics are recorded similarly by increasing the input drive from the signal source.