TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Ensuring Test Site Compliance for Radiated Emissions With Normalized Site Attenuation
This application note provides a synopsis of Normalized Site Attenuation (NSA) and Reference Site Method measurements which indicate a challenging but important aspect of radiated emissions measurements on an OATS, SAC, or FAR.
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Mastering O-RAN Radio Unit (O-RU) Testing
How Kyrio found its perfect O-RAN conformance T&M solution from Rohde & Schwarz and VIAVI Solutions.
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Directivity And VSWR Measurements: Understanding Return Loss Measurements
The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.
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Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle
Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.
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Characterizing Parasitic Components In Power Converters
With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions