TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Testing For Coexistence In Crowded And Contested RF Environments

    In this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.

  • How To Configure Generic Devices In R&S Elektra

    R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

  • Speeding Up Reflection Measurements On Antenna Systems

    Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

  • Verifying The Clock Source

    In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

  • Waveform Acquisition Rate And Why It Matters

    Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.

TEST & MEASUREMENT SOLUTIONS

Producing a system that excels in performance and reliability is easy when you have System Design and Applications Engineers with years of experience, Customer Service with global reach, and products that are known for performance and quality. AR has this very organization and product offerings. AR is here for you at each step to ensure that the system design, integration, and support of your EMC or RF system complies with your goals.

The dB-3907 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3907 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

The RFvision-3 is a tunable ultra-wideband spectrum processing solution designed for 1 GHz bandwidth RF spectrum recording with advanced pulse processing. This rack-mount (3U) system is based on the DTA-9590W ultra-wideband tuner and DTA-5000 RAID server with 24 TB SSDs. It operates from 500 MHz to 18 GHz (expandable up to 40 GHz) and features 100 MHz instantaneous bandwidth.

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.