TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

  How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

• Selecting Your Next Oscilloscope: Why Digital Triggering Matters

  Many people tend to overlook the importance of triggering while selecting an oscilloscope, but it's actually a crucial factor to consider. Digital triggering can offer some significant advantages.

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• Design Of A Complete RF Downconverter Module For Test Equipment

   The example module and its constituent parts were designed and simulated with AWR Design Environment software using circuit- and system-level analyses. The integration of the downconverter within a mechanical outline influences the layout of the individual radio blocks.