TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Electronic Packaging: Using EMI Material-Based Solutions

    It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

  • On-Wafer Characterization At sub-THz Frequencies

    New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

  • Mastering O-RAN Radio Unit (O-RU) Testing

    How Kyrio found its perfect O-RAN conformance T&M solution from Rohde & Schwarz and VIAVI Solutions.

  • Field Probe Correction Factors

    To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.

  • Wi-Fi Performance In A House With Two Routers

    Wireless InSite’s Communication System Analyzer provides capabilities for assessing the performance of LTE, WiMAX, 802.11n, and 802.11ac systems. This example investigates WiFi throughput coverage in a house provided by 802.11ac routers operating at 5 GHz using an 80 MHz bandwidth.

TEST & MEASUREMENT SOLUTIONS

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

The A.H. Systems' line of Current Probe Calibration Fixtures are a great way to keep your broadband Current Probes, and Injection Current Probes calibrated and up to date. Their rugged design ensures long life, and faultless operation over the wide calibration frequency range of 10 kHz to 1000 MHz.

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

The Si4133G Dual-Band RF synthesizer is a fast settling integer-N synthesizer

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

Qorvo offers the CMD240C4 wideband GaAs MMIC distributed amplifier housed in a leadless 4x4 mm surface mount package. The amplifier operates from DC to 22 GHz and is ideal for radar, space, satcom, test and measurement, and electronic warfare applications.