RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

Solving Tomorrow's Obsolescence Challenges Today
This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.
Perform High Impedance Measurements With Spectrum Analyzers
Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.
Making Higher Accuracy Oscilloscope Measurements
One of the most important functional blocks in a digital oscilloscope is the analog-to-digital converter or ADC. This white paper explains why ADC resolution has become a more important consideration in oscilloscopes, especially for measuring small signal details.
What Is Pulse Shaping?
In this industry briefing,George Bollendorf explains a new approach to fix fidelity issues caused by the transmitting amplifier that matches input pulse signal shape, minimizes droop, overshoot, ringing, and rise and fall times.
Verifying The Clock Source
In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

More Test & Measurement Application Notes and White Papers

TEST & MEASUREMENT SOLUTIONS

AR Predefined Systems

Producing a system that excels in performance and reliability is easy when you have System Design and Applications Engineers with years of experience, Customer Service with global reach, and products that are known for performance and quality. AR has this very organization and product offerings. AR is here for you at each step to ensure that the system design, integration, and support of your EMC or RF system complies with your goals.

Microwave And RF Test Assemblies: GORE® PHASEFLEX® Series

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

Capacitance Meter

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

Si894x Isolated Delta-Sigma Modulator For Current Measurement

The Si894x is a galvanically isolated delta-sigma modulator which outputs a digital signal proportional to the voltage level at the input.

8-Channel A/D & D/A QuartzXM eXpress Module: Model 6003

Pentek offers the Quartz® Model 6003 high-performance Quartz eXpress Module (QuartzXM) based on the Xilinx Zynq UltraScale+ RFSoC FPGA. The RFSoC FPGA integrates eight RF-class A/D and D/A converters into the Zynq’s multiprocessor architecture, creating a multichannel data conversion and processing solution on a single chip.

Portable ELINT Data Collection Solution With Spectrum Awareness And Advanced Pulse Processing

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

XFdtd Superposition For Advanced Phased Array Design

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Surface Mount Mixer And Detector Schottky Diodes: SMS7630 Series

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

More Test & Measurement Solutions