TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
-
![appnote22]( "Understanding Component EMC Testing for ICs")
Understanding Component EMC Testing for ICsIf you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.
-
![image1]( "Effortless Testing Of Direction Finding Devices – Amplitude Based")
Effortless Testing Of Direction Finding Devices – Amplitude BasedTogether with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques.
-
![WiFi Performance In A House with Two Routers]( "Wi-Fi Performance In A House With Two Routers")
Wi-Fi Performance In A House With Two RoutersWireless InSite’s Communication System Analyzer provides capabilities for assessing the performance of LTE, WiMAX, 802.11n, and 802.11ac systems. This example investigates WiFi throughput coverage in a house provided by 802.11ac routers operating at 5 GHz using an 80 MHz bandwidth.
-
Top 5 Strategies For 5G Component Characterization And Test
Component manufacturers need to deploy effective strategies for characterization and test regardless of the component types. This white paper presents five strategies for 5G component characterization and testing.
-
![Rohde - scenario example]( "Testing For Coexistence In Crowded And Contested RF Environments")
Testing For Coexistence In Crowded And Contested RF EnvironmentsIn this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.
TEST & MEASUREMENT SOLUTIONS
Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.
The Si894x is a galvanically isolated delta-sigma modulator which outputs a digital signal proportional to the voltage level at the input.
The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.
The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.
The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.
The dB-3907 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3907 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions
