TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• Top 10 Considerations For Automotive EMC Chamber Design And Testing

  This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

• De-Embedding Test Fixtures For High-Speed Digital Applications

  Test fixtures are commonly used in high-speed digital measurement to connect devices to measurement equipment. Characterization and analysis in time and frequency domains help remove the influence of these fixtures.

• Perform High Impedance Measurements With Spectrum Analyzers

  Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

• EMC32 To R&S ELEKTRA Migration Using The ELEKTRA Migration Tool

  Discover how to use the R&S ELEKTRA Migration Tool for converting the backup data into the XML format that can be interpreted by the R&S ELEKTRA software.