TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Power Supply Control Loop Response Measurements (Bode Plot)

  The R&S^® RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers. 

• Reduce Risk With A Better Measurement Process

  Measurement risk is the probability of making an incorrect decision. Many quality standards require calibration to reduce measurement risk. This white paper explores calibration, how it mitigates risk, as well as different calibration deliverables that can reduce testing costs.

• Transmit And Receive Testing Of Digital Waveforms Using R&S®CMA180

  The compact R&S®CMA180 Radio Test Set allows straightforward tests on devices that use analog or digital modulation and demodulation formats. This application note focuses on the use of the digital radio capabilities for measurements on radio transceiving devices in terms of their functionality and parameter characterization. Also shown is how to use the instrument with the various software tools available from Rohde & Schwarz for creating and evaluating digitally modulated signals.

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz

  Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.