TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.

• Test Automotive Radar Interference Mitigation

  Automotive radar is crucial for achieving Net Zero targets in the automobile industry, and the R&S AREG800A radar echo generator is essential for testing sensor immunity to interference.

• Understanding Component EMC Testing for ICs

  If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• Perform High Impedance Measurements With Spectrum Analyzers

  Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.