TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Power Consumption Analysis With Specialty DC Power Supplies

    Optimizing power consumption is critical for IoT devices running on small, non-rechargeable batteries. Learn how accurate characterization and smart design can extend device lifespans.

  • Noise Figure: What Is It And Why Does It Matter?

    Noise figure is a key parameter that quantifies receiver performance by measuring how low a power a signal receiver can detect. This white paper covers the basic principles of noise figure, how to make sense of its specifications, how it is measured, and why this parameter is important in high-performance applications.

  • Verifying The Clock Source

    In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

  • Design And Implementation Of A Miniature X-Band Edge-Coupled Microstrip Bandpass Filter

    Microwave bandpass filters are the fundamental component used in many RF/microwave applications to eliminate interference from signals operating at nearby frequencies. This application note presents a straightforward and largely nonmathematical method for designing an edge-coupled, bandpass filter for X-band operations with a combination of filter synthesis, closed-form edge-coupled transmission-line models, and EM analysis using the Microwave Office circuit simulator within Cadence AWR Design Environment software.

  • Perform High Impedance Measurements With Spectrum Analyzers

    Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

TEST & MEASUREMENT SOLUTIONS

The A.H. Systems' line of Current Probe Calibration Fixtures are a great way to keep your broadband Current Probes, and Injection Current Probes calibrated and up to date. Their rugged design ensures long life, and faultless operation over the wide calibration frequency range of 10 kHz to 1000 MHz.

The 50S-2133 SMA from JFW is a solid-state, self-terminating 1P8T RF switch designed for economical automated RF testing applications in the 20 – 5,000 MHz frequency range.

Radar simulation systems (i.e., RF sources and/or receivers) must perform to an exacting minimum standard if they are to accurately prove the field worthiness of EW systems.

Pentek offers the Talon® RTX 2684 as a 26 GHz sentinel intelligent signal scanner recording system. The system provides SIGINT engineers the ability to scan the RF spectrum from 1 GHz to 26 GHz for signals of interest and monitor or record bandwidths up to 500 MHz wide.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Model HP 4268A is a capacitance meter designed for testing high value multilayer ceramic capacitor (MLCC) designs

Holzworth’s multi-channel RF synthesizer architecture is a complete success story. These compact, 1U high, 19in rack mountable chassis can be configured with up to 8 independently tunable channels. All integrated channels are 100% phase coherent. Holzworth has designed the multi-channel platform for integration of our HSM Series Single Channel Synthesizers to maximize channel-to-channel stability via a conductively cooled, fan-less enclosure.

dB Control’s family of traveling wave tube amplifiers (TWTAs) features a combined frequency range of 2 to 18 GHz up to 15kW output power. dB Control utilizes our proprietary transformer fabrication, encapsulation and high-voltage potting techniques developed for demanding military applications which results in superior reliability, low cost and ease of maintenance.  Products in this series are ideal for several applications, including: test and measurement, electronic warfare (EW) simulation, RFI/EMI/EMC Testing, electronic countermeasures (ECM), and antenna pattern and radar-cross section measurements.