TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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R&S®FSWP And The Validity Of Positive Phase Noise Values
This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.
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Testing For Coexistence In Crowded And Contested RF Environments
In this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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Navigating Design Complexities With Qorvo's Innovative Software Tools
Unlock the power of Qorvo's Design Hub, providing engineers with cutting-edge RF and analog design tools previously exclusive to Qorvo teams. Streamline your projects with precision and efficiency.
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What Is Pulse Shaping?
In this industry briefing,George Bollendorf explains a new approach to fix fidelity issues caused by the transmitting amplifier that matches input pulse signal shape, minimizes droop, overshoot, ringing, and rise and fall times.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions