TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Effortless Testing Of Direction Finding Devices – Amplitude Based

  Together with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques. 

• Harmonic Measurement For IEC 61000-4-3 And Other Radiated Immunity Standards

  Amplifiers exhibiting significant harmonic distortion in immunity test systems can exhibit broadband characteristics that result in measurement uncertainty and unacceptable errors. This app note addresses acceptable harmonic measurement standards and other radiated immunity standards.

• Understanding Component EMC Testing for ICs

  If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.