TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle

  Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.

• Power Supply Control Loop Response Measurements (Bode Plot)

  The R&S^® RTx-K36 frequency response analysis (Bode plot) option provides a low-cost alternative to low frequency network analyzers or dedicated standalone frequency analyzers. 

• Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

  The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S^® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

• Load Transient Response – Enhancing Loop Stability Testing

  Ensuring stability in power supply design requires validating switching converter stability through frequency loop and load transient responses, aided by modern oscilloscopes for visualizing PWM signals and identifying converter effects.

• Making Higher Accuracy Oscilloscope Measurements

  One of the most important functional blocks in a digital oscilloscope is the analog-to-digital converter or ADC. This white paper explains why ADC resolution has become a more important consideration in oscilloscopes, especially for measuring small signal details.