TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Verifying The Clock Source

  In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

• Testing For Coexistence In Crowded And Contested RF Environments

  In this paper, we review some of the key research, development, test and evaluation (RDT&E) challenges that arise when developing and deploying systems that need to operate in congested and/or contested RF environments.

• R&S®FSWP And The Validity Of Positive Phase Noise Values

  This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.

• Solving Tomorrow's Obsolescence Challenges Today

  This white paper discusses best practices in operations implementation, hardware acquisition, and software design to reduce the sustainment burden of handling obsolescence in test systems long before the equipment goes end of life.

• Field Probe Correction Factors

  To better achieve accurate field level measurements, it is helpful to have an understanding of field probe calibrations, the factors generated, and what’s presented as data during testing. This application note presents how to utilize the factors presented for inclusion into test data, how to generate composite measurements, and why calibrations are performed at selected frequencies.