TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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S-Parameters For High-frequency Circuit Simulations
Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.
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Waveform Acquisition Rate And Why It Matters
Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.
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Effortless Testing Of Direction Finding Devices – Amplitude Based
Together with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques.
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VCO Measurements With FSPN Phase Noise Analyzer
This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.
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eUICC Profile Handling
This application note describes the eUICC compliance and remote eUICC provisioning test solution based on R&S CMW500/CMW290 and COMPRION eUICC Profile Manager software tool with focus on M2M devices.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions