TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Voltage Standing Wave Ratio (VSWR) Explained

  Explore the evolution of VSWR from its humble beginnings in telegraph lines to its vital role in modern RF engineering, illuminating its practical applications and underlying principles.

• Electronic Packaging: Using EMI Material-Based Solutions

  It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

• Waveform Acquisition Rate And Why It Matters

  Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.

• VCO Measurements With FSPN Phase Noise Analyzer

  This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.

• S-Parameters For High-frequency Circuit Simulations

  Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.