TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces
In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.
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On-Wafer Characterization At sub-THz Frequencies
New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.
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Speeding Up Reflection Measurements On Antenna Systems
Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.
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How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope
This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.
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Effortless Testing Of Direction Finding Devices – Amplitude Based
Together with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions