TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• AC-DC Converter Testing Fundamentals

  AC-DC conversion stage in front of any electronic equipment is needed. For this purpose, different solutions exist to convert the higher AC voltage to a lower and safe DC voltage.

• RF Amplifier Output Voltage, Current, Power, And Impedance Relationship

  How much output voltage, current, and power can you expect from your amplifier? In rare cases, this can be answered by applying Ohm’s law, assuming that the net power or power delivered to the load is the rated power output of the amplifier. In most cases, practical issues such as VSWR and forward power concerns must be considered before applying Ohm’s law. This application note addresses this issue and discusses an approach to be used that applies actual test data when calculating output parameters.

• Telecommunications Testing Using AR Amplifiers

  This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.

• Perform High Impedance Measurements With Spectrum Analyzers

  Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.