TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

  • Speeding Up Reflection Measurements On Antenna Systems

    Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

  • What Is Pulse Shaping?

    In this industry briefing,George Bollendorf explains a new approach to fix fidelity issues caused by the transmitting amplifier that matches input pulse signal shape, minimizes droop, overshoot, ringing, and rise and fall times.

  • Waveform Acquisition Rate And Why It Matters

    Explore key specifications of modern digital oscilloscopes, including often overlooked ones like acquisition rate and blind time, to better understand their importance in oscilloscope applications.

  • Measurement Of The Phase Between Several Signals

    Measurement of magnitude can be done with spectrum analyzers, power meters etc. For a phase measurement, a VNA is the easiest, fastest and most accurate instrument. 

  • Combining On-Wafer VNA And Spectrum Analyzer Measurements

    This app note describes how S-parameters and spectrum analysis can be monitored simultaneously from 70 kHz to 110 GHz using the VectorStar ME7838A, the Spectrum Master MS2760A, and the Anritsu MN25110A W1 coaxial precision directional coupler.

TEST & MEASUREMENT SOLUTIONS

Holzworth Instrumentation was founded as a phase noise measurement company. Along the path to phase noise analysis solutions, our high performance building blocks were developed and sold in the form of RF Synthesizers, Phase Detectors, etc. The HA7401A is a Fixed Frequency Phase Noise Analyzer, and the HA7402A is a Phase Noise Measurement Engine.

Qorvo offers the CMD240C4 wideband GaAs MMIC distributed amplifier housed in a leadless 4x4 mm surface mount package. The amplifier operates from DC to 22 GHz and is ideal for radar, space, satcom, test and measurement, and electronic warfare applications.

The GORE® PHASEFLEX® Series offers the smallest, lightest, internally ruggedized microwave/RF test assemblies for high density interconnection in RF and uW modular applications as well as in high speed digital testing. These assemblies feature ON cable construction and provide consistent, repeatable measurements with electrical performance up to 18, 26.5, 40, or 50 GHz.

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

The series of GORE® VNA microwave/RF test assemblies from W.L. Gore are designed to provide the most precise VNA measurements in laboratory conditions, setting the standard for vector network analyzers (VNAs) through 70 GHz. These test assemblies deliver the highest accuracy and greatest time intervals between recalibrations for many applications, including those with vector network analyzers, critical measurements, and laboratory testing.

Bird offers the FH-AV-KIT, a FlightHawk™ RF Aviation Test Kit designed for avionics testing and measurement applications. This kit includes a proven antenna and cable testing functionality of the FlightHawk handheld analyzer, all necessary adapters and cabling, and Bird’s aviation testing software that allows anyone on the maintenance team to test and verify all antenna systems in a fleet.

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.