TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• Navigating Design Complexities With Qorvo's Innovative Software Tools

  Unlock the power of Qorvo's Design Hub, providing engineers with cutting-edge RF and analog design tools previously exclusive to Qorvo teams. Streamline your projects with precision and efficiency.

• S-Parameters For High-frequency Circuit Simulations

  Understanding the meaning of S-parameters, how they are measured, and their limitations can lead to more meaningful RF- and microwave-frequency simulations.

• Ensuring Test Site Compliance for Radiated Emissions With Normalized Site Attenuation

  This application note provides a synopsis of Normalized Site Attenuation (NSA) and Reference Site Method measurements which indicate a challenging but important aspect of radiated emissions measurements on an OATS, SAC, or FAR.  

• Directivity And VSWR Measurements: Understanding Return Loss Measurements

  The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.