TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Verifying The Clock Source

  In order to select or develop a clock generator to use in your design or to ensure that the supplied system clock has the proper performance, you'll need to consider phase noise, jitter, wideband noise and spurs as performance indicators.

• Four Practical Applications Using An Electronic Load

  This article presents four tips on how to test with electronic loads and illustrate the flexibility and usefulness of a DC electronic load. 

• Accurately Measure Your UWB Device's Time Of Flight

  The R&S®CMP200 radio communication tester together with the R&S®CM-Z300A time of flight kit provides an accurate setup for time of flight measurements – in validation, calibration and certification.

• Characterization Of An Amplifier With The Combination Of Network And Spectrum Analysis

  The general characterization of complex DUTs such as amplifiers requires the measurement of several parameters. Thanks to its versatility, the R&S^® ZNL is an economic solution that can characterize a variety of DUTs both via network analysis and spectrum analysis.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.