TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces

  In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.

• Noise Figure: What Is It And Why Does It Matter?

  Noise figure is a key parameter that quantifies receiver performance by measuring how low a power a signal receiver can detect. This white paper covers the basic principles of noise figure, how to make sense of its specifications, how it is measured, and why this parameter is important in high-performance applications.

• Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz

  Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.

• Small Cell Testing In FR2

  In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.

• Introduction To RNVNA, A Multiport Network Analysis Solution

  In many RF applications it is necessary to make multiport measurements. The RNVNA, a multiport network analysis solution, links up to 16 1-Port analyzers together into a multiport network analysis system. Each of the 16 analyzers will make individual vector reflection measurements and scalar transmission measurements from port to port.