TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
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Accurate Test Fixture Characterization And De-Embedding
This application note provides practical hints to accurately characterize and de-embed these lead-in and lead-out structures with R&S Vector Network Analyzers ZNA, ZNB, ZNBT and ZND.
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Simplify Coexistence And Interference Testing For GNSS Receivers
The R&S®SMW200A GNSS simulator offers an easy and convenient way to test your receiver design against a wide variety of potential interferers and jammers. Test cases extend from simple coexistence simulations to complex interference scenarios with localized emitters.
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Circuit Models For Plastic Packaged Microwave Diodes
This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.
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AC-DC Converter Testing Fundamentals
AC-DC conversion stage in front of any electronic equipment is needed. For this purpose, different solutions exist to convert the higher AC voltage to a lower and safe DC voltage.
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R&S®FSWP And The Validity Of Positive Phase Noise Values
This white paper reviews the classical spectrum analyzer measurement of L(f) and its shortcomings. It also discusses how modern phase noise test sets measure phase noise and avoid the limitations imposed by direct spectrum measurements, especially with the use of the R&S®FSWP.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions