TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• VCO Measurements With FSPN Phase Noise Analyzer

  This application note provides a short technical introduction to voltage-controlled oscillators and explains the most common and the most important measurements made during the VCO characterization process.

• Telecommunications Testing Using AR Amplifiers

  This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.

• An Introduction To Direction Finding Methodologies

  All direction finding methodologies are meant to determine the physical or geographical location of a source of radio frequency energy. The choice of an appropriate direction finding methodology to use for a given application is largely a function of the target signal's characteristics, such as frequency and modulation, but is also influenced by the propagation environment as well as cost and complexity.  Recent advances in the development of hybrid direction finding methodologies attempt to overcome some of these restrictions and increase accuracy by using a combination of methodologies.

• Electronic Packaging: Using EMI Material-Based Solutions

  It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.