TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces

  In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• Qorvo Biotechnologies Sensor-Based Technology Provides Rapid Reference-Lab Quality Tests At Point-of-Care

  This white paper describes Qorvo Biotechnologies’ Bulk Acoustic Wave (BAW) immunosensor detection platform designed for point-of-care applications and describes analytical and functional sensitivity testing on human Thyroid Stimulating Hormone (hTSH) as an example. The Qorvo Biotechnologies’ platform is targeted to be central lab matched, with the goal of providing clinicians data that will enable quicker decision making across multiple disease states, such as in cardiac and infectious disease segments, where time to result and high performance are critical factors in the patient care workflow.

• Telecommunications Testing Using AR Amplifiers

  This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.