TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
-
Linearity Of The JFET And MOSFET When In Saturation Over The Entire Cycle
Performing RF amplification in a way that is simultaneously linear and efficient has been a challenge in power amplifier (PA) design. Single transistor PAs can either be operated in a linear, but inefficient, current source mode of operation or as efficient, but nonlinear, switches. These techniques use two FETs, but this paper demonstrates that linear amplification can be achieved at high power with an efficiency greater than 60%, using a single FET.
-
Measurement Setup For Phase Noise Test At Frequencies Above 50 GHz
Recent semiconductor technologies require more of the frequency range beyond 50 GHz, especially in wideband applications, such as 802.11ad, microwave links, or automotive RADAR. Low phase noise is essential for these applications to work properly, and accurate measurement of phase noise is needed to improve the performance. However, test setups at these frequencies become difficult, especially when cross correlation of two receive paths is needed to suppress additional phase noise.
-
Telecommunications Testing Using AR Amplifiers
This application note explores a number of testing requirements for telecommunication devices and how to benefit from AR RF/Microwave Instrumentation’s products. The paper will cover two broad categories of device testing – characterization and reliability – within mid to high power systems.
-
How To Configure Generic Devices In R&S Elektra
R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.
-
Understanding Component EMC Testing for ICs
If you're producing integrated circuit (IC) products for electromagnetic environments, you must test and pass all the regulatory electromagnetic interference (EMI) and safety requirements. Electromagnetic compatibility (EMC) testing is performed to ensure these components can be used in the intended environment without failing, degrading, or causing other equipment to fail.
TEST & MEASUREMENT NEWS
- Rohde & Schwarz Mobile Network Testing Forum Goes Hybrid For 2023
- JCAS Reference Test Setup From Rohde & Schwarz Receives GTI Award For Innovative Breakthrough In Mobile Technology
- CAICT Selected R&S CMX500 OBT To Enable SPEAG DASY8 System For SAR And HAC Tests Of 5G NR Devices
- Rohde & Schwarz Announces Major Boost For Phase Noise Analysis And VCO Measurements Portfolio
- AVL And Rohde & Schwarz Collaborate To Automate And Speed Up EMC Tests Under Real Driving Conditions