RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

Small Cell Testing In FR2
In the era of 5G, small cells have become pivotal in network densification. Explore the essential testing aspects of small cell devices throughout their product life cycle.
Qorvo Biotechnologies Sensor-Based Technology Provides Rapid Reference-Lab Quality Tests At Point-of-Care
This white paper describes Qorvo Biotechnologies’ Bulk Acoustic Wave (BAW) immunosensor detection platform designed for point-of-care applications and describes analytical and functional sensitivity testing on human Thyroid Stimulating Hormone (hTSH) as an example. The Qorvo Biotechnologies’ platform is targeted to be central lab matched, with the goal of providing clinicians data that will enable quicker decision making across multiple disease states, such as in cardiac and infectious disease segments, where time to result and high performance are critical factors in the patient care workflow.
Battery Simulation With DC Power Supplies
This application note guides users in creating custom battery models for R&S^®NGM200 and R&S^®NGU201 power supplies, enabling gradual battery discharge via QuickArb and data logging, with recorded data adaptable for battery simulation using a provided developer tool.
How To Test USB Power Delivery Over Type-C
USB Type-C compliance test standards are more complex due to higher data transmission speeds and more power. Successful testing requires accurate and compliant test instruments, software, and fixtures.
eUICC Profile Handling
This application note describes the eUICC compliance and remote eUICC provisioning test solution based on R&S CMW500/CMW290 and COMPRION eUICC Profile Manager software tool with focus on M2M devices.

More Test & Measurement Application Notes and White Papers

TEST & MEASUREMENT SOLUTIONS

1800 W, 65 V, 1.0 – 1.1 GHz Highest Power GaN Transistor On The Market: QPD1025L

Qorvo offers the 1800 W, 65 V, 1.0 – 1.1 GHz QPD1025L as the highest GaN transistor on the market. This discrete GaN on SiC HEMT has a package that features input pre-match resulting in ease of external board match and saved board space.

Integrated Stabilized RF Source: dB-9003, dB-9005

The dB-9003 and dB-9005 from dB Control are custom-mounted Integrated Stabilized RF Sources (ISRFS) designed to operate in the I and Ka-band frequency range. Both products feature high accuracy and a wide temperature operating range. They can be controlled and set up with a digital port. The units are packaged in a custom configuration with conduction cooling.

Surface Mount Mixer And Detector Schottky Diodes: SMS7630 Series

The SMS7630 Series comprises low-cost, surface mountable, plastic packaged silicon mixer Schottky diodes designed for RF and microwave mixers and detectors. They include low barrier diodes and zero-bias detectors that combine Skyworks advanced semiconductor technology with low-cost packaging techniques. All diodes are 100 percent DC tested and deliver tight parameter distribution, which minimizes performance variability.

Microwave VME/VXS Tuner: SRX-00140-VME

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

MXO 5 Series Oscilloscope

The MXO 5 Series delivers breakthrough oscilloscope technology to speed up your understanding and testing of electronic systems.

Instantaneous Frequency Measurement Unit: dB-9001

The dB-9001 from dB Control is a custom-mounted Instantaneous Frequency Measurement (IFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

Electrostatic Discharge (ESD) Testing Simulation

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.