TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Speeding Up Reflection Measurements On Antenna Systems

  Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

• Four Practical Applications Using An Electronic Load

  This article presents four tips on how to test with electronic loads and illustrate the flexibility and usefulness of a DC electronic load. 

• Electronic Packaging: Using EMI Material-Based Solutions

  It can be difficult when individual components could pass EMI testing but, as the components are combined into subsystems or into the final product, the DUT fails. Incorporating EMI shielding materials as part of an initial design is the most cost-effective way to prevent these last-minute issues during testing.

• EMI Debugging Using Fast FFT With MXO Oscilloscopes

  Explore the MXO oscilloscope's EMI debugging capabilities, including gated FFT, superior RF performance, and advanced analysis features.

• How To Analyze Passive Low Frequency Components With A Rohde & Schwarz Oscilloscope

  This white paper presents a technique for easily and quickly analyzing low frequency response on an oscilloscope with the R&S®RTx-K36 frequency response analysis (Bode plot) option, which uses the oscilloscope’s built-in waveform generator to create stimulus signals ranging from 10 Hz to 25 MHz.