TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Perform High Impedance Measurements With Spectrum Analyzers

  Modern RF circuit designs can use oscilloscope probes to directly probe circuit components, eliminating the need for traditional RF connectors and ensuring accurate measurements with high-impedance probes and spectrum analyzers.

• DPX® Acquisition Technology For Spectrum Analyzers Fundamentals

  Signal detection is the first step in characterizing, diagnosing, understanding, and resolving any problem that relates to time-variant signals. Engineers are requiring better tools to help find and interpret complex signal behaviors and interactions. The Tektronix Digital Phosphor technology, or DPX®, can be used in Real-Time Spectrum Analyzers (RSAs) to reveal signal details that are completely missed by conventional spectrum analyzers and vector signal analyzers. This white paper describes the methods behind the DPX Live RF spectrum display, swept DPX, Time-Domain DPX Displays, DPX Density™ measurements, DPX Density™ and Frequency Edge triggers.

• Quantum-Enabled Radar Research: Finding The Right Solution

  Examine how high-precision measurement of oscillators helped UK Quantum Technology Hub research to develop high-precision radar for detecting small objects such as drones and birds.

• Characterizing Parasitic Components In Power Converters

  With the rise of wide-bandgap semiconductors like GaN and SiC, characterizing parasitic components in power converters is crucial for maintaining efficiency and preventing performance issues.

• Effortless Testing Of Direction Finding Devices – Amplitude Based

  Together with multiple coupled R&S SMW200A vector signal generators, the R&S Pulse Sequencer allows performance characterization of all types of direction finding equipment such as devices that use amplitude comparison, interferometric or time difference of arrival (TDOA) techniques.