TEST AND MEASUREMENT APPLICATION NOTES AND WHITE PAPERS
Application Note: Reflectometer Measurements - Revisited Twenty four years ago Wiltron (now Anritsu) published a Technical Review "Why Tolerate Unnecessary Measurement Errors", long since out of print...
Group Delay and Phase Measurement on Frequency Converters
Frequency converters such as those found in satellite transponders need to be characterized not only in terms of amplitude transmission but also in terms of phase transmission or group delay, especially with the transition to digital modulation schemes. They often do not provide access to the internal local oscillators. This application note describes a method using the R&S ZVA to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.
Low Noise Amplifier Testing Challenges
Designers, modelers, and manufacturers of RF and microwave frequency amplifiers used in applications such as radar, wireless communication, or high-speed digital communication systems at either the wafer-level or as a packaged part face many test challenges. Higher performance requirements in the face of tighter budgets and more demands on test engineer time result in the need for test systems which provide technical leadership while remaining cost effective, easy to use, and flexible.
Testing LTE Release 9 Features
LTE – the fastest growing mobile radio standard – had its beginnings in 3GPP Release 8. Initial improvements and new features were implemented in Release 9. This Application Note describes the T&M methods for LTE Release 9 features using Rohde & Schwarz instruments.
Receiving BEIDOU, GALILEO and GPS Signals with MATLAB and R&S IQR, R&S TSMW
This application note demonstrates remote operation of Rohde & Schwarz instruments using SCPI commands and attribute based drivers directly out of MATLAB scripts and functions.