RF Test And Measurement Resource Center

TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

Battery Cycle Tool For The R&S NGU401/NGU201/NGM200/NGL200
The battery cycle tool has several charts that display collected data and can be used to characterize battery samples and create battery models.
Directivity And VSWR Measurements: Understanding Return Loss Measurements
The characterization of microwave networks requires discriminating between forward and backward traveling waves. Unfortunately no directional device is perfect, leading to potentially dramatic measurement errors. In this note we show that return loss and VSWR measurements are greatly complicated by the finite performance of the directional device used to measure the reflected power.
Transmit And Receive Testing Of Digital Waveforms Using R&S®CMA180
The compact R&S®CMA180 Radio Test Set allows straightforward tests on devices that use analog or digital modulation and demodulation formats. This application note focuses on the use of the digital radio capabilities for measurements on radio transceiving devices in terms of their functionality and parameter characterization. Also shown is how to use the instrument with the various software tools available from Rohde & Schwarz for creating and evaluating digitally modulated signals.
Ray-Optical Modeling Of Wireless Coverage Enhancement Using Engineered Electromagnetic Surfaces
In this paper, results are presented of propagation experiments conducted to verify the accuracy of a novel ray-optical scattering model for EES.
Speeding Up Reflection Measurements On Antenna Systems
Reflection measurements are a common way of assessing antenna system performance. When a minimum amount of the transmitted signal is reflected, it indicates that the transmission energy can reach the intended coverage. Undesired high reflection causes the system to be inefficient and can damage components. This application note presents solutions for aiding fast and efficient reflection measurements on antenna systems to get it right the first time.

More Test & Measurement Application Notes and White Papers

TEST & MEASUREMENT SOLUTIONS

Portable ELINT Data Collection Solution With Spectrum Awareness And Advanced Pulse Processing

D-TA Systems offers the MFEL 1000 portable ELINT data collection solution designed to provide automatic spectrum scanning for signal activity (pulse or CW), PDW extraction and de-interleaving to tracks where signal characterization is performed automatically. The system includes a built-in 6 TB (expandable to 18 TB) SSD data storage for I/Q data collection in both on-site and off-site analysis.

Microwave VME/VXS Tuner: SRX-00140-VME

The Microwave VME/VXS Tuner by Hunter Technology is the industry’s smallest available microwave SIGINT VME tuner. It covers the 500 MHz-20.0 GHz and 30.0 GHz to 40.0 GHz frequency ranges and features incredibly fast tuning, low phase noise, excellent mechanical conductivity, a single slot 6U VME configuration, and much more.

TWT Amplifier: dB-3908

The dB-3908 TWT Amplifier (TWTA) is designed to use two wideband, periodic permanent magnet (PPM)-focused TWTs to amplify CW, AM, FM or pulse-modulated signals. The dB-3908 offers higher saturated output power and improved harmonic performance when compared to a single TWT approach.

Extended Frequency Spectrum Analyzer: EVO-RSA-6070A

The EVO-RSA-6070A is part of the EVO Series of extended frequency spectrum analyzers from Avcom designed for higher performance and agility in applications with continuously changing requirements. The included SDR-style technology analyzer includes a wide bandwidth receiver and employs FPGA, DSP, and high-performance processors.

Dual Instantaneous Frequency Measurement Unit: dB-9002

The dB-9002 from dB Control is a custom-mounted Dual Instantaneous Frequency Measurement (DIFM) unit designed to operate in the C, X, and Ku-band frequency range and provide highly accurate measurements at 100 ns to CW pulse width measurements.

Electrostatic Discharge (ESD) Testing Simulation

Electrostatic discharge testing is utilized worldwide by electronics manufacturers to determine the ESD susceptibility of their devices. It is extremely difficult to estimate the exact cost of ESD loss annually, but it can safely be stated that ESD requires the development and testing of many hardware prototypes and contributes to a high number of warranty claims and loss of consumer confidence if failure occurs in the hands of the customer. Given the high cost in time and materials associated with ESD hardware testing, the ability to simulate the ESD testing process in XFdtd is extremely valuable, allowing engineers to pinpoint locations susceptible to ESD damage and optimize ESD mitigation during the concept and design stage of product development.

XFdtd Superposition For Advanced Phased Array Design

XF leverages the EM principle of superposition to quickly analyze port phase combinations with a single simulation.

Small Form Factor 8-Channel RF A/D & D/A Subsystem: Model 6350S

The Model 6350S is a small form factor 8-channel A/D & D/A subsystem designed for a variety of applications including high-bandwidth data streaming, waveform signal generators, multimode data acquisition, and other electronic warfare systems. Designed to be integrated into larger systems with minimal design effort, the 6350S delivers the performance and high-channel density of RFSoC in a small, convenient footprint.

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