TEST & MEASUREMENT APPLICATION NOTES AND WHITE PAPERS

• Measurement Of The Phase Between Several Signals

  Measurement of magnitude can be done with spectrum analyzers, power meters etc. For a phase measurement, a VNA is the easiest, fastest and most accurate instrument. 

• How To Configure Generic Devices In R&S Elektra

  R&S ELEKTRA is able to communicate with many devices. Still, it is impossible to integrate drivers for all devices. Hence, R&S ELEKTRA offers the possibility to integrate any device by configuring a generic driver.

• On-Wafer Characterization At sub-THz Frequencies

  New technologies and applications extend into sub-THz frequencies in the D band and beyond. New semiconductor technologies and processes need to be commercialized to support these efforts.

• Top 10 Considerations For Automotive EMC Chamber Design And Testing

  This resource will help you avoid the most common mistakes and outlines the important things to consider to successfully develop or refine an automotive EMC chamber and test design.

• Circuit Models For Plastic Packaged Microwave Diodes

  This paper reports on the measurement and establishment of circuit models for SOT-23 and SOD-323 packaged diodes. Results indicate that the 1.5 nH estimate for the SOT-23 is a useful result, as is 1.2 nH for SOD-323 single packaged diodes. It was also determined that the effective inductance of the SOT-23 may be reduced to approximately 0.4 nH by adding a second bond wire and modifying the microstrip line. Other lead configurations, including parallel bond wires and common cathode configurations, were also studied.