Probes

PRODUCTS AND SERVICES

BCP-510 Broadband Current Probe

BCP-510 Broadband Current Probe

This current probe measures currents on 50 Hz, 60 Hz and 400 Hz powerlines. The BCP-510 current probes have a usable frequency range of 20 Hz - 1 MHz.
Isotropic "H" Field Probe, 300 kHz - 30 MHz, 0.012 - 17 A/m

Isotropic "H" Field Probe, 300 kHz - 30 MHz, 0.012 - 17 A/m

The FH7103 is a broadband isotropic magnetic field measurement instrument for use in EMC and EMI applications.
EM Probe Systems

EM Probe Systems

Schmid and Partner Engineering’s line of Time Domain Sensor (TDS) probes are used to detect EMC/EMI, MRI, and antenna measurements.

BCP-518 Broadband Current Probe

BCP-518 Broadband Current Probe

Ideally suited to measuring currents for the immunity requirements of DO-160 and IEC-1000-4-6 on large cables. It has a usable frequency range of 10 kHz to 500 MHz.
Electric Field Laser Powered Probe, 100 kHz to 6 GHz, 0.5 to 800 V/m

Electric Field Laser Powered Probe, 100 kHz to 6 GHz, 0.5 to 800 V/m

The FL7006 is a smart, fast, extremely accurate electric field probe that contains an internal microprocessor to provide linearization, temperature compensation, control, and communication functions.
RF Field Probes And Monitors

RF Field Probes And Monitors

These E-field laser probes contain an internal microprocessor that enables them to "think" for themselves and adapt to their environment. This provides optimal linearization, temperature compensation, control, and communication functions. AR's six E&H field probes cover the range from 100 kHz - 60 GHz, 0.4 to 1,000 V/m, 0.012 to 17 A/m.

Electric Field Laser Powered Probe, 5 kHz to 30 MHz, 1.5 to 300 V/,

Electric Field Laser Powered Probe, 5 kHz to 30 MHz, 1.5 to 300 V/,

The FL7030 is a smart, fast, extremely accurate electric field probe that contains an internal microprocessor to provide linearization, temperature compensation, control, and communication functions.
<B>Current Probes</b>

Current Probes

Conducted currents can be measured without making direct contact with the source conductor or metallic surface by means of clamp-on broadband current probes.
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