A.H. Systems offers a comprehensive line of Current Probe devices designed to be used in the process of generating and measuring high levels of RF current, and in many industrial and scientific applications. They can be used to measure conducted currents without making direct contact with the source conductor or metallic surface.
These E-field laser probes contain an internal microprocessor that enables them to "think" for themselves and adapt to their environment. This provides optimal linearization, temperature compensation, control, and communication functions. AR's six E&H field probes cover the range from 100 kHz - 60 GHz, 0.4 to 1,000 V/m, 0.012 to 17 A/m.
The Video Inspection Probe Lite (VIP Lite) application for Anritsu field testing platforms gives operators a safe, easy way to analyze and document connector conditions. With today’s high data rate, high definition services, connector quality and inspection have never been so important. Research reveals that up to 75% of all optical network failures are attributed to poor connector quality - reduce your installation time and ensure your network is reaching its full potential.
Schmid and Partner Engineering’s line of Time Domain Sensor (TDS) probes are used to detect EMC/EMI, MRI, and antenna measurements.