ACTIVE COMPONENTS APPLICATION NOTES AND WHITE PAPERS
Improved Switching Architectures for ATE Systems
This application note discuss how to avoid common pitfalls in switching architectures for ATE systems and provides insight on designing a good test system.
The Importance of Switching: A Tutorial
This tutorial discusses the difficulty in choosing switches in test-system designs, and the important role a properly integrated switch can play in test system designs. Different types of switching solutions are also explored, as well as variations in maximum switching voltage and current, power ratings, and more.
Impact of Switching on ATE Measurements
This application discusses the factors that should be considered when designing or implementing an ATE switching system. Some of the factors discussed in detail include noise, bandwidth limitations, measurement uncertainty, grounding, and accuracy.
Power Handling Considerations for SMD Terminations, Attenuators, and Resistors
Power ratings for Anaren’s SMD Terminations, Attenuators, and Resistors are based off of the temperature at the solder interface where the solder is in contact with the SMD components. This application note describes the power rating of high power surface mount resistive products, as well as techniques for maximizing power handling performance of these products.
High Temperature, High Power RF Life Testing Of GaN On SiC RF Power Transistors
As GaN power device technology matures and gains acceptance in the market place, suppliers who provide products using this promising technology must prove its reliability. This article provides an overview of the testing approaches used to establish failure rates and will provide a comparison of DC and RF based HTOL methods.