Microwave Expert Douglas Kent Rytting To Receive IEEE Award

Piscataway, NJ -- The IEEE has named Douglas K. Rytting as the recipient of its 2007 Joseph F. Keithley Award in Instrumentation and Measurement, recognizing his seminal technical and leadership contributions to microwave network analyzer technology. Sponsored by Keithley Instruments, Incorporated., the award recognizes outstanding contributions in electrical measurements. It will be presented to Rytting at the 2007 IEEE/MTT-S International Microwave Symposium in Honolulu on 5 June.

Rytting has been involved with virtually all Hewlett Packard and Agilent Technologies microwave network analyzers introduced since he joined HP in 1966.

The network analyzers he developed test the design of components and devices used in high-frequency electronics including communications, satellite, radar and other systems to ensure they meet their design objectives. In production, the network analyzers test manufacturing specifications to ensure that components are working correctly. He also developed key new hardware designs and measurement applications for the network analyzers.

Rytting's earliest designs were in the first network analyzers introduced by Hewlett Packard in the 1960s. Later he managed the development of automatic network analyzers, RF network analyzers and microwave network analyzers, and helped launch HP's Microwave CAE Design Software. He helped support the architecture design of HP's microwave performance network analyzer family and developed new measurement methods, instrument and system block diagrams and error correction techniques in the microwave industry for Agilent.

He led the development of error correction methods, accuracy analysis, nonlinear measurements and general measurement techniques in the microwave industry, all of which revolutionized measurements for microwave network analysis. In addition, he introduced new concepts and algorithms that form the basis for many modern microwave network analyzer calibrations.

Retired from HP/Agilent Technologies, he is now consulting on microwave measurements and calibration techniques at Rytting Consulting, Santa Rosa, California.

An IEEE member, Rytting has a bachelor's degree from Utah State University, where he received the Outstanding Senior Engineer Award. He also has a master's degree from Stanford University.

For more information about the IEEE Joseph F. Keithley Award in Instrumentation and Measurement, click here.

SOURCE: IEEE