Video
Video: Agilent EEsof System-Level X-Parameters In SystemVue 2010 And Genesys 2010 Provide Architecture-To-Verification Design Flow Closure Demo
Until now, nonlinear analog X-parameter models have focused narrowly on RF circuit designers. Now with system-level implementations in Agilent's SystemVue 2010.01 and Genesys 2010.05 platforms, X-parameters move beyond RF into System-level design. The nonlinear model support provides convenient and reliable design flow closure between wireless circuit designers, RF system architects, and non-analog colleagues doing communications PHY algorithms and baseband signal processing. In this video from IMS2010, Daren McClearon from Agilent EEsof demonstrates SystemVue.
The content you requested is only available to registered users of RF Globalnet. By registering now, you'll get exclusive access to this piece of content and thousands of addtional articles and product reviews across our entire network of sites.
