Walt Strickler

Walt Strickler, a senior product manager at Anritsu Company, has more than 20 years of experience with RF and microwave technology in the aerospace and test and measurement industries. He holds a BSEE from the University of Akron and an MBA from Case Western Reserve University. He can be reached at walter.strickler@anritsu.com.

ARTICLES BY WALT STRICKLER

  • Pulsed VNA Measurements: When And Why Do I Need To Re-Calibrate?
    4/16/2014

    This is the final installment of a guest series written by Walt Strickler of Anritsu Company.

  • Simplifying Pulsed VNA Measurements With An Advanced UI
    2/21/2014

    In this vector network analyzer (VNA) article series, we have discussed how engineers use VNAs to measure modern radar systems and explored new methods to more accurately test today’s complex radar signals. In this installment, I’d like to examine the advantages of an advanced user interface (UI) when making a pulsed VNA measurement. By Walt Strickler, Anritsu Company

  • VNA Advances Meet Challenges Of Advanced Radar Systems
    1/9/2014

    This column focuses on improvements made to VNA architectures and their importance in testing today’s more advanced radar systems.

  • Testing Modern Radar System Signals: A Primer
    8/28/2013

    The demands placed on modern radars create challenges for both the radar designer and test engineer. Advanced radar systems require greater precision to measure narrower pulse widths and/or to examine intra-pulse behavior with finer resolution, including rise/fall edge effects or the profile within a pulse compression signal. In order to best understand the complexity of testing today’s radar designs, it is good to first review some basic applications of radar systems and the fundamentals of pulse measurements. By Walt Strickler, senior product manager, Anritsu Company

More Articles by Walt Strickler