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The wireless communications market has exploded in the last several years. As a result, frequency usage and commercial wireless applications have continued to move rapidly toward the millimeter-wave range. The emergence of millimeter-wave wireless applications including LMDS, WLAN, and automotive anti-collision radar has brought with it new demands for device characterization systems that address the operation of transistors at millimeter-wave frequencies.

The new MT900N family of millimeter-wave device characterization systems was developed to provide customers with a set of state-of-the-art characterization tools for the development of circuit design methodologies that extract increased performance from a given fabrication process by enhancing transistor operating range and linearity. MT900N millimeter-wave noise parameter and load-pull measurement systems encompass a wide range of high-performance component test tools to address the growing needs of new millimeter-wave applications. Specific models and added options offer higher levels of measurement capability, including noise parameters, gain compression, harmonic, IMD, output power contours, and many other measurement features, in addition to fast and accurate S-parameter measurements. Complete measurement solutions to 50, 75, 90, and 110 GHz are available.

Maury Microwave offers noise parameters and large-signal test systems for both on-wafer and packaged device measurements. Measurement setups have been developed for V band (50 to 75 GHz), E band (60 to 90 GHz) and W band (75 to 110 GHz). Noise parameters are measured as functions of frequency or bias conditions and are based on the commonly used cold-noise source method. They are determined from measured noise figure versus source impedance data. Large-signal characterization is performed versus source and load impedance using tuners at the input and output of the device under test.

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•Product Feature: Fully Integrated Millimeter-Wave Device Characterization Systems