01.11.22 -- Spotlight On Test And Measurement Solutions

This application note describes a method using the R&S® ZNA analyzer family to measure group delay of mixers and frequency converters with an embedded local oscillator very accurately.

In anticipation of this development, over the last few years JFW has introduced numerous new products to support testing the full range of frequencies allotted by Wi-Fi 6E.

New RFSoC technologies add RF-class analog-to-digital and digital-to-analog data converters to Xilinx’s family of FPGAs. This white paper looks at current trends in data converters and signal processing to better understand the capabilities of RFSoC and how to best use the technology.

Qorvo customizable PMICs offer an alternative to catalog power devices, providing the agility and design flexibility to accommodate diverse applications and wide-ranging market needs. The quick-design, fast-turnaround capabilities of Qorvo PMICs enable companies to introduce competitive products to market.

Along with numerous technical issues, test engineers are continuously facing time and schedule time constraints. The oscilloscope of the future aims to include all test instruments within a single box.

Krytar’s product line meets the needs of a diverse, growing customer base and relies on partners who share a commitment to service. This case study discusses Krytar’s partner, Sunstone, and the advantages of working with them to deliver the highest quality customized products.

EMI protection is a fundamental element of system design, but poor prioritization, unexpected sources of interference, or a lack of in-house answers can leave designers stumped for solutions.

This document covers design and fabrication considerations used in Mini-Systems' thick film processes to maximize the performance of their high-reliability chip resistors in surface-mount adhesion, automated electronic assembly, electrical performance, bondability, and more.