Newsletter | November 26, 2019

11.26.19 -- Spotlight On EMC, EMI, And Signal Integrity

Featured Article
Specifying RF/Microwave Power Amplifiers For EMC Testing – HIRF And High Frequency Field Generating Systems
Application Note | AR

This article is part three of AR’s series, “Specifying RF/Microwave Power Amplifiers for EMC Testing,” and details the design requirements for HIRF and high frequency field generating systems.

Spotlight On EMC, EMI, And Signal Integrity
Electromagnetic Compatibility In Connected And Electrified Vehicles
White Paper | By Jens Wülfing, TE Connectivity

This paper shows how TE Connectivity addresses EMC during component development using the example of an interconnection system for automotive Ethernet and focusing primarily on point-to-point connections for sensor data fusion and data transmission via the Ethernet network.

MIL-STD-461 Testing Advantages Using Time Domain Scan EMI Receivers
Application Note | Rohde & Schwarz GmbH & Co. KG

This application note compares the measurement speed and level measurement accuracy of a conventional swept frequency spectrum analyzer against the speed and accuracy of advanced time domain scanning. 

Filter Shape Factor And Selectivity
Article | Knowles Precision Devices DLI

This article discusses how a real-world filter’s deviation from ideal behavior needs to be quantified and that shape factor and selectivity are tools to use in this process. It touches on how both resonator Q and the filter order (number of resonators in a design) can influence a filter’s behavior in the transition band.

The Increasing Impact Of Speed And Miniaturization On Rugged Connector Selection
White Paper | By David Cianciolo, Fischer Connectors

Design engineers are challenged to pump increasing amounts of data through smaller and smaller spaces. This paper provides a step-by-step process for rugged connector selection that takes the new realities engineers face today into consideration, such as speed and miniaturization.

Leading The Way In The Broadband Component And Testing Industry
Case Study | Krytar

Krytar’s product line meets the needs of a diverse, growing customer base and relies on partners who share a commitment to service. This case study discusses Krytar’s partner, Sunstone, and the advantages of working with them to deliver the highest quality customized products every time.

Product Catalog: Electronic Package Division
Catalog | Mini-Systems, Inc.

Mini-Systems, Inc., offers microelectronic package solutions in sizes and configurations for virtually any application. We deliver high-quality products at a competitive price and on time. Our 20+ years of packaging experience allows us to understand your requirements quickly and accurately.

Development Tactics And Techniques For Small Form Factor RF Signal Recorders
White Paper | By Chris Tojeira, Pentek, Inc.

This paper describes the engineering considerations and design techniques used to develop a small form factor rugged recorder that can handle the extremely high data rates associated with very wide bandwidth RF signal recording. 


Defense Strategies Institutes' 4th Annual Joint Networks Summit will take place this January 29th and 30th, 2020, at the Parma Payne Goodall Center in San Diego, California. Sessions for this summit will focus on this year’s theme, "Leveraging Joint Networking Capabilities to Ensure Continued Operational Success."

Featured Multimedia
Protecting Against Radiation Hazards In RF Transmitter Design: A Simulation-Driven Approach

Radiation hazards have to be within standardized limits for many different hazard applications, like human safety (HERP), fuel (HERF), and ordnance (HERO). EM simulation is vital for the identification of field levels for individual frequency components of antennas that operate in complex environments. This webinar presentation demonstrates how Altair Feko has been applied to solve a range of EMC problems, including radiation analysis and radiation hazard (RADHAZ) zone analysis.

Bulletin Board
5 Tips To Optimize Your Transmitter Tests

This e-book is meant to help the reader achieve cleaner measurement results. Topics covered include how to test more effectively, how to apply corrections for a test setup, optimize resolution bandwidth, increase sensitivity when measuring low-level signals, minimize the analyzer’s distortion products, and increase speed, accuracy, and reliability with measurement applications.

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