By Accel-RF Corporation
Gallium Nitride (GaN) technology is growing to be the essential technology of choice in applications ranging from space and military systems to consumer electronics. As the technology in GaN devices matures, the long-term reliability issues must be tested and addressed. Test system capabilities must expand to perform not only traditional elevated temperature life testing, but must also allow for in-situ performance-degradation characterization with age. Accel-RF’s platform solution is the only available integrated instrument that can demonstrate a compliance with aerospace, government, and commercial RF semiconductor life-test standards with all desired capabilities. Download this white paper for further discussion on the recent history of and current trends within GaN reliability testing.