The mm-wave Automated Accelerated Reliability Test System (AARTS) from Accel-RF Solutions is a fully integrated, automated, turnkey system designed to determine RF and DC performance degradation with aging to accurately predict the life expectancy for compound semiconductor devices. With the ability to perform multidimensional dynamic testing, the AARTS can automatically perform 3-temperature life tests and component characterization.
The mm-wave AARTS operates in standard frequencies ranging from 26.5 to 67 GHz. This system stimulates independent RF drive levels for each DUT with individual frequency ranges up to 78 GHz, and input drive levels up to 0.25 W with an SSPA option. Two independent DC bias sources are available as either constant voltage or constant current. Independent temperature control for each DUT ranges from +50°C to +250°C.
For additional information on the mm-wave AARTS, download the brochure.