Epsilometer Solution For Measuring Dielectric Properties
Source: Copper Mountain Technologies
Copper Mountain Technologies offers the Epsilometer solution for measuring the dielectric properties of substrate materials from 3 MHz up to 6 GHz and can accommodate sheet specimens from 0.3 to 3 mm thick. A database in the software for the device is used to invert properties and is populated up to a permittivity of 25.
Material specimens are inserted into the device and scanned to obtain their microwave response versus frequency. Unlike previous dielectric analysis technologies, this new method uses computational electromagnetic modeling to invert the dielectric permittivity and loss.
Download the datasheet for more information.
This website uses cookies to ensure you get the best experience on our website. Learn more