White Paper

Combining Near-Field Measurement And Simulation For EMC Radiation Analysis

Source: Altair Engineering Inc

By Altair Engineering Inc

Combining Near-Field Measurement And Simulation For EMC Radiation Analysis

Failing a required EMC test at the end of a product design cycle can imply a costly product redesign and drastically set back the time-to-market. This white paper outlines a process that enables required EMC testing to be performed much earlier in the design cycle. The practical method combines near-field measurements and simulation to explore the radiation behavior of electronic components. Download the full paper to learn how this approach not only enables near-field characterizations and far-field predictions, but also detailed system level analysis of how the component radiates in its installed environments.