Products and Services
SMART^E™ 5300 General RF-Microwave Test Environment
•Datasheet: SMART^E™ 5300 General RF-Microwave Test Environment
•Brochure: SMART^E™ 5300 General RF-Microwave Test Environment
•Fact Sheet: SMART^E™ 5300 General RF-Microwave Test Environment
The SMART^E™ 5300 General RF-Microwave Test Environment provides a modular approach for implementing multi-function, configurable test systems. The SMART^E™ 5300 is a completely integrated environment with all the hardware and software needed for test execution, test reporting, test analysis, calibration, diagnostic, and DUT monitoring and control. A SMART^E™ 5300 RF/microwave Test System can perform measurements that traditionally would require five or more separate RF/microwave instruments. The SMART^E™ 5300 utilizes multi-functional stimulus and response measurement hardware channels highly integrated with Digital Signal Processing software (rather than a collection of dedicated function instruments) to generate signals and perform measurements. This unique combination of integrated tests, system calibration methods, diagnostic tools and superior throughput yields the lowest total cost of test over the life cycle of the environment.
The 5300 configuration also provides emulation of many special purpose microwave instruments utilizing a single test environment:
- RF Signal Generator
- Spectrum Analyzer
- Power Meter
- Noise Figure Meter
•Datasheet: SMART^E™ 5300 General RF-Microwave Test Environment
•Brochure: SMART^E™ 5300 General RF-Microwave Test Environment
•Fact Sheet: SMART^E™ 5300 General RF-Microwave Test Environment
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