Products and Services
Millimeter-Wave Device Characterization Systems
Source:
Maury Microwave Corporation
The new MT900N family of millimeter-wave device characterization systems from Maury Microwave was developed to provide customers with a set of state-of-the-art characterization tools for the development of circuit design methodologies that extract increased performance from a given fabrication process by enhancing transistor operating range and linearity...
The new MT900N family of millimeter-wave device characterization systems from Maury Microwave was developed to provide customers with a set of state-of-the-art characterization tools for the development of circuit design methodologies that extract increased performance from a given fabrication process by enhancing transistor operating range and linearity. MT900N millimeter-wave noise parameter and load-pull measurement systems encompass a wide range of high-performance component test tools to address the growing needs of new millimeter-wave applications. Specific models and added options offer higher levels of measurement capability, including noise parameters, gain compression, harmonic, IMD, output power contours, and many other measurement features, in addition to fast and accurate S-parameter measurements. Complete measurement solutions to 50, 75, 90, and 110 GHz are available.
•Product Feature: Fully Integrated Millimeter-Wave Device Characterization Systems
Click Here To Download:
•Product Feature: Fully Integrated Millimeter-Wave Device Characterization Systems
