Products and Services
LTE FDD Measurement Suite
•Product Capabilities Overview: PXI
•Product Overview: PXI Modular RF Test System
•Datasheet: PXI Studio
The LTE FDD measurement suite is a library of measurement functions designed to characterize LTE FDD signals in accordance with the requirements of ETSI TS 36.521-1 (3GPP release 8).
- Power
- Transmit signal quality:
- Frequency Error
- Error Vector Magnitude (EVM)
- IQ skew/Gain Imbalance
- Symbol clock error
- IQ-component (carrier leak)
- In-band emissions for non allocated RB
- Spectrum flatness
- Output RF spectrum emissions:
- Occupied bandwidth
- Spectrum Emission Mask
- Adjacent Channel Leakage power Ratio
- CCDF
LTE analysis is supported for uplink (SC-FDMA) transmissions for all bandwidths 1.4 MHz to 20 MHz and modulation types QPSK, QAM16 and QAM64. In addition to numerical measurement results, the measurement suite provides trace displays for spectrum emission mask, CCDF, constellation plots, EVM vs Carrier and EVM vs Symbol. EVM analysis for uplink signals is supported for PUSCH.
The LTE FDD measurement suite is designed for PXI based RF test systems used in the development and manufacturing of mobile radio transmitters, sub-modules and RFICs (radio frequency integrated circuits). The measurement suite enables the PXI 3000 to transfer its high speed, performance and flexibility benefits to the production floor for efficient LTE device testing.
Click Here To Download:•Product Capabilities Overview: PXI
•Product Overview: PXI Modular RF Test System
•Datasheet: PXI Studio
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