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Click Here To Download:
•Product Capabilities Overview: PXI
•Product Overview: PXI Modular RF Test System
•Datasheet: PXI Studio

A suite of measurement functions to characterize Bluetooth® and Bluetooth® EDR radio signals in accordance with the requirements of Bluetooth® Specification 1.2/2.0/2.0+EDR/2.1/2.1+EDR revision 2.1E1 (2008).

• Burst position and power
  • EDR relative to Tx power
• Spectrum
  • -20dB bandwidth
  • Power density
  • Occupied bandwidth
  • Adjacent channel power
  • EDR spurious emissions
• Modulation characteristics
• Initial carrier frequency tolerance
• Carrier frequency drift and drift Rate
• Burst profile
• Modulation accuracy
• CW measurements

The Bluetooth® measurement suite enables fast measurement of key signal characteristics of Bluetooth® and Bluetooth® EDR signals such as burst power, PSK modulation accuracy, initial and maximum frequency error and origin offset.

The Bluetooth® measurement suite is suitable for characterising devices operated in test mode. Measurement results for burst length, position, rise and fall times and power are provided for the entire packet as well as the individual GFSK and PSK modulated elements within the packet. For PSK modulation, the DEVM is reported together with max frequency error and origin offset. Time domain trace displays are provided for burst power, GFSK frequency deviation and DEVM. Additionally PSK modulation can be viewed as a constellation diagram.

The Bluetooth® measurement suite is designed for PXI based RF test systems used in the development and manufacturing of Bluetooth® devices.

For manufacturing tests of mobile handsets, the Bluetooth® measurement suite enables the PXI 3000 to transfer its high speed, performance and flexibility benefits to the production floor.

Click Here To Download:
•Product Capabilities Overview: PXI
•Product Overview: PXI Modular RF Test System
•Datasheet: PXI Studio