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Product Overview: PXI Modular RF Test System

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Description

The PXI 3000 Series achieves up to five times higher throughput than conventional instrumentation leading the market in terms of test speed. Low test times are the result of very fast responding hardware and the performance gains derived from the use of multi-core processors. Multiple simultaneous measurements and multi-device testing becomes a reality when realizing the benefits of multi-core processing through the inherent open software architecture.

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